Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7928754 | Wafer level burn-in and electrical test system and method | Donald P. Richmond, II, John Hoang | 2011-04-19 |
| 7619428 | Wafer level burn-in and electrical test system and method | Donald P. Richmond, II, John Hoang | 2009-11-17 |
| 6682945 | Wafer level burn-in and electrical test system and method | Donald P. Richmond, II, John Hoang | 2004-01-27 |
| 6580283 | Wafer level burn-in and test methods | Mark C. Carbone, Frank O. Uher, John Andberg, Donald P. Richmond, II | 2003-06-17 |
| 5884395 | Assembly structure for making integrated circuit chip probe cards | Krzysztof Dabrowiecki, January Kister | 1999-03-23 |
| 5742174 | Membrane for holding a probe tip in proper location | January Kister | 1998-04-21 |