DI

Donald P. Richmond, II

AS Aehr Test Systems: 48 patents #2 of 36Top 6%
CH Chipscale: 4 patents #7 of 7Top 100%
Lam Research: 1 patents #1,364 of 2,128Top 65%
📍 Palo Alto, CA: #324 of 9,675 inventorsTop 4%
🗺 California: #6,949 of 386,348 inventorsTop 2%
Overall (All Time): #47,006 of 4,157,543Top 2%
54
Patents All Time

Issued Patents All Time

Showing 1–25 of 54 patents

Patent #TitleCo-InventorsDate
12326472 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson 2025-06-10
12163999 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2024-12-10
11860221 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2024-01-02
11448695 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson 2022-09-20
11255903 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2022-02-22
10976362 Electronics tester with power saving state Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2021-04-13
10852347 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2020-12-01
10718808 Electronics tester with current amplification Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2020-07-21
10677843 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson 2020-06-09
10488437 Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode David S. Hendrickson 2019-11-26
10151793 Electronics tester with double-spiral thermal control passage in a thermal chuck Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2018-12-11
10094872 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2018-10-09
9874583 Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode David S. Hendrickson 2018-01-23
9857418 Electronics tester with group and individual current configurations Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2018-01-02
9500702 Electronics tester with hot fluid thermal control Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2016-11-22
9316683 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2016-04-19
9291668 Electronics tester with a valve integrally formed in a component of a portable pack Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2016-03-22
9250291 System for testing an integrated circuit of a device and its method of use Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson 2016-02-02
9151797 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2015-10-06
9086449 Adhesively attached stand-offs on a portable pack for an electronics tester Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon 2015-07-21
8986048 Integrated feedthrough module David S. Hendrickson, Jovan Jovanovic, William D. Barraclough 2015-03-24
8747123 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2014-06-10
8628336 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2014-01-14
8506335 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2013-08-13
8388357 Apparatus for testing electronic devices Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more 2013-03-05