Issued Patents All Time
Showing 25 most recent of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12326472 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2025-06-10 |
| 12298328 | Controlling alignment during a thermal cycle | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2025-05-13 |
| 12292484 | Method and system for thermal control of devices in an electronics tester | Kenneth W. Deboe, Steven C. Steps | 2025-05-06 |
| 12282062 | Electronics tester | Gaylord Lewis Erickson, II | 2025-04-22 |
| 12265136 | Method and system for thermal control of devices in electronics tester | Kenneth W. Deboe, Steven C. Steps | 2025-04-01 |
| 12253560 | Electronics tester | Gaylord Lewis Erickson, II | 2025-03-18 |
| 12228609 | Electronics tester | Gaylord Lewis Erickson, II | 2025-02-18 |
| 12169217 | Electronics tester | Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey | 2024-12-17 |
| 12163999 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2024-12-10 |
| 12007451 | Method and system for thermal control of devices in an electronics tester | Kenneth W. Deboe, Steven C. Steps | 2024-06-11 |
| 11977098 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2024-05-07 |
| 11860221 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2024-01-02 |
| 11835575 | Electronics tester | Gaylord Lewis Erickson, II | 2023-12-05 |
| 11821940 | Electronics tester | Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey | 2023-11-21 |
| 11635459 | Electronics tester | Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey | 2023-04-25 |
| 11592465 | Pressure relief valve | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2023-02-28 |
| 11448695 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2022-09-20 |
| 11255903 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2022-02-22 |
| 11209497 | Method and system for thermal control of devices in an electronics tester | Kenneth W. Deboe, Steven C. Steps | 2021-12-28 |
| 11199572 | Electronics tester | Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey | 2021-12-14 |
| 11112429 | Pressure relief valve | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2021-09-07 |
| 10852347 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2020-12-01 |
| 10677843 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2020-06-09 |
| 10649022 | Electronics tester | Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey | 2020-05-12 |
| D875579 | Layout of contacts | Scott E. Lindsey, Steven C. Steps, David S. Hendrickson | 2020-02-18 |