Issued Patents All Time
Showing 26–50 of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466292 | Method and system for thermal control of devices in an electronics tester | Kenneth W. Deboe, Steven C. Steps | 2019-11-05 |
| 10401385 | Limiting translation for consistent substrate-to-substrate contact | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2019-09-03 |
| D850309 | Layout of contacts | Scott E. Lindsey, Steven C. Steps, David S. Hendrickson | 2019-06-04 |
| 10094872 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2018-10-09 |
| 9880197 | Controlling alignment during a thermal cycle | Scott E. Lindsey, Junyje Yeh, Seang P. Malathong | 2018-01-30 |
| 9625521 | Controlling alignment during a thermal cycle | Scott E. Lindsey, Junjye Yeh, Seang P. Malathong | 2017-04-18 |
| 9316683 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2016-04-19 |
| 9250291 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2016-02-02 |
| 9151797 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2015-10-06 |
| 8986048 | Integrated feedthrough module | David S. Hendrickson, Donald P. Richmond, II, William D. Barraclough | 2015-03-24 |
| 8947116 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, Junyje Yeh, Seang P. Malathong | 2015-02-03 |
| 8747123 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2014-06-10 |
| 8628336 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2014-01-14 |
| 8506335 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2013-08-13 |
| 8388357 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2013-03-05 |
| 8228085 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2012-07-24 |
| 8118618 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +7 more | 2012-02-21 |
| 8030957 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, Junyje Yeh, Seang P. Malathong | 2011-10-04 |
| 7969175 | Separate test electronics and blower modules in an apparatus for testing an integrated circuit | David S. Hendrickson, Donald P. Richmond, II, William D. Barraclough | 2011-06-28 |
| D630166 | Connector | Scott E. Lindsey, David S. Hendrickson | 2011-01-04 |
| D629760 | Interface on an electronics connector | Scott E. Lindsey, David S. Hendrickson | 2010-12-28 |
| 7800382 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, David S. Hendrickson, Donald P. Richmond, II | 2010-09-21 |
| 7762822 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Scott E. Lindsey, Thomas T. Maenner +1 more | 2010-07-27 |
| 7511521 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Donald P. Richmond, II | 2009-03-31 |
| 7385407 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Donald P. Richmond, II | 2008-06-10 |