| 12326472 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2025-06-10 |
| 11448695 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2022-09-20 |
| 10677843 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2020-06-09 |
| D875579 |
Layout of contacts |
Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps |
2020-02-18 |
| 10488437 |
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode |
Donald P. Richmond, II |
2019-11-26 |
| D850309 |
Layout of contacts |
Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps |
2019-06-04 |
| 9874583 |
Electronics tester with output circuits operable in voltage compensated power mode, driver mode or current compensated power mode |
Donald P. Richmond, II |
2018-01-23 |
| 9250291 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2016-02-02 |
| 8986048 |
Integrated feedthrough module |
Jovan Jovanovic, Donald P. Richmond, II, William D. Barraclough |
2015-03-24 |
| 8228085 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2012-07-24 |
| 7969175 |
Separate test electronics and blower modules in an apparatus for testing an integrated circuit |
Jovan Jovanovic, Donald P. Richmond, II, William D. Barraclough |
2011-06-28 |
| D630166 |
Connector |
Scott E. Lindsey, Jovan Jovanovic |
2011-01-04 |
| D629760 |
Interface on an electronics connector |
Scott E. Lindsey, Jovan Jovanovic |
2010-12-28 |
| 7800382 |
System for testing an integrated circuit of a device and its method of use |
Scott E. Lindsey, Jovan Jovanovic, Donald P. Richmond, II |
2010-09-21 |
| 7063544 |
System for burn-in testing of electronic devices |
Bradley R. Gunn, Alberto Calderon, Jovan Jovanovic |
2006-06-20 |
| 6815966 |
System for burn-in testing of electronic devices |
Bradley R. Gunn, Alberto Calderon, Jovan Jovanovic |
2004-11-09 |