| 10976362 |
Electronics tester with power saving state |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2021-04-13 |
| 10718808 |
Electronics tester with current amplification |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2020-07-21 |
| 10151793 |
Electronics tester with double-spiral thermal control passage in a thermal chuck |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2018-12-11 |
| 9857418 |
Electronics tester with group and individual current configurations |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2018-01-02 |
| 9500702 |
Electronics tester with hot fluid thermal control |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2016-11-22 |
| 9291668 |
Electronics tester with a valve integrally formed in a component of a portable pack |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2016-03-22 |
| 9086449 |
Adhesively attached stand-offs on a portable pack for an electronics tester |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2015-07-21 |
| 8198909 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2012-06-12 |
| 7902846 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2011-03-08 |
| 7667475 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II |
2010-02-23 |
| 7063544 |
System for burn-in testing of electronic devices |
Bradley R. Gunn, Jovan Jovanovic, David S. Hendrickson |
2006-06-20 |
| 6815966 |
System for burn-in testing of electronic devices |
Bradley R. Gunn, Jovan Jovanovic, David S. Hendrickson |
2004-11-09 |