| 12326472 |
System for testing an integrated circuit of a device and its method of use |
Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II |
2025-06-10 |
| 12298328 |
Controlling alignment during a thermal cycle |
Junjye Yeh, Jovan Jovanovic, Seang P. Malathong |
2025-05-13 |
| 12169217 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps |
2024-12-17 |
| 12163999 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more |
2024-12-10 |
| 11977098 |
System for testing an integrated circuit of a device and its method of use |
Junjye Yeh, Jovan Jovanovic, Seang P. Malathong |
2024-05-07 |
| 11860221 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more |
2024-01-02 |
| 11821940 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps |
2023-11-21 |
| 11635459 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps |
2023-04-25 |
| 11592465 |
Pressure relief valve |
Junjye Yeh, Jovan Jovanovic, Seang P. Malathong |
2023-02-28 |
| 11448695 |
System for testing an integrated circuit of a device and its method of use |
Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II |
2022-09-20 |
| 11255903 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more |
2022-02-22 |
| 11199572 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps |
2021-12-14 |
| 11112429 |
Pressure relief valve |
Junjye Yeh, Jovan Jovanovic, Seang P. Malathong |
2021-09-07 |
| 10976362 |
Electronics tester with power saving state |
Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2021-04-13 |
| 10852347 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more |
2020-12-01 |
| 10718808 |
Electronics tester with current amplification |
Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2020-07-21 |
| 10677843 |
System for testing an integrated circuit of a device and its method of use |
Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II |
2020-06-09 |
| 10649022 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps |
2020-05-12 |
| D875579 |
Layout of contacts |
Jovan Jovanovic, Steven C. Steps, David S. Hendrickson |
2020-02-18 |
| 10401385 |
Limiting translation for consistent substrate-to-substrate contact |
Junjye Yeh, Jovan Jovanovic, Seang P. Malathong |
2019-09-03 |
| D850309 |
Layout of contacts |
Jovan Jovanovic, Steven C. Steps, David S. Hendrickson |
2019-06-04 |
| 10151793 |
Electronics tester with double-spiral thermal control passage in a thermal chuck |
Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2018-12-11 |
| 10094872 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more |
2018-10-09 |
| 9880197 |
Controlling alignment during a thermal cycle |
Junyje Yeh, Jovan Jovanovic, Seang P. Malathong |
2018-01-30 |
| 9857418 |
Electronics tester with group and individual current configurations |
Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2018-01-02 |
