Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9625521 | Controlling alignment during a thermal cycle | Junjye Yeh, Jovan Jovanovic, Seang P. Malathong | 2017-04-18 |
| 9500702 | Electronics tester with hot fluid thermal control | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2016-11-22 |
| 9316683 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2016-04-19 |
| 9291668 | Electronics tester with a valve integrally formed in a component of a portable pack | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2016-03-22 |
| 9250291 | System for testing an integrated circuit of a device and its method of use | Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II | 2016-02-02 |
| 9151797 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2015-10-06 |
| 9086449 | Adhesively attached stand-offs on a portable pack for an electronics tester | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2015-07-21 |
| 8947116 | System for testing an integrated circuit of a device and its method of use | Junyje Yeh, Jovan Jovanovic, Seang P. Malathong | 2015-02-03 |
| 8747123 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2014-06-10 |
| 8628336 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2014-01-14 |
| 8506335 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2013-08-13 |
| 8388357 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2013-03-05 |
| 8228085 | System for testing an integrated circuit of a device and its method of use | Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II | 2012-07-24 |
| 8198909 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2012-06-12 |
| 8118618 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +7 more | 2012-02-21 |
| 8030957 | System for testing an integrated circuit of a device and its method of use | Junyje Yeh, Jovan Jovanovic, Seang P. Malathong | 2011-10-04 |
| 7902846 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2011-03-08 |
| D630166 | Connector | Jovan Jovanovic, David S. Hendrickson | 2011-01-04 |
| D629760 | Interface on an electronics connector | Jovan Jovanovic, David S. Hendrickson | 2010-12-28 |
| 7800382 | System for testing an integrated circuit of a device and its method of use | Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II | 2010-09-21 |
| 7762822 | Apparatus for testing electronic devices | Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Thomas T. Maenner +1 more | 2010-07-27 |
| 7667475 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2010-02-23 |
| 7131848 | Helical microelectronic contact and method for fabricating same | Charles A. Miller, David M. Royster, Stuart Wenzel | 2006-11-07 |
| 7053644 | System for testing and burning in of integrated circuits | Carl Buck, Rhea Posedel | 2006-05-30 |
| 6948940 | Helical microelectronic contact and method for fabricating same | Charles A. Miller, David M. Royster, Stuart Wenzel | 2005-09-27 |