Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7053644 | System for testing and burning in of integrated circuits | Scott E. Lindsey, Carl Buck | 2006-05-30 |
| 6025732 | Reusable die carrier for burn-in and burn-in process | See-Hack Foo, Larry J. Lape, James Wrenn, Ernie Wang, Paul Burke +1 more | 2000-02-15 |
| 5517125 | Reusable die carrier for burn-in and burn-in process | Larry J. Lape, James Wrenn | 1996-05-14 |