See-Hack Foo — 1 Patent at Aehr Test Systems

See-Hack Foo has been granted 1 US patent while listed as an inventor at Aehr Test Systems. All of these patents were granted in 2000. See-Hack Foo ranks #2,406,284 of 4,157,543 US inventors in our database (top 57.9%). Patent records list See-Hack Foo in Fremont, CA, US.

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6025732	Reusable die carrier for burn-in and burn-in process	Rhea Posedel, Larry J. Lape, James Wrenn, Ernie Wang, Paul Burke +1 more	2000-02-15	$745,000

See-Hack Foo — 1 Patent

Issued Patents All Time

Patent Widget