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Charles A. Miller — 147 Patents

FOFormfactor: 104 patents #4 of 177Top 3%

TZThe C.W. Zumbiel: 19 patents #2 of 18Top 15%

CSCredence Systems: 11 patents #6 of 214Top 3%

AMAmp: 4 patents #316 of 1,383Top 25%

TAThe United States Of America As Represented By The Administrator Of The Environmental Protection Agency: 2 patents #5 of 61Top 9%

W&Whitaker &: 2 patents #399 of 1,437Top 30%

AOAol: 1 patents #1,006 of 1,465Top 70%

Spring Grove, PA: #1 of 56 inventorsTop 2%

Pennsylvania: #68 of 74,527 inventorsTop 1%

Overall (All Time): #6,491 of 4,157,543Top 1%

147 Patents All Time

Charles A. Miller has been granted 147 US patents while listed as an inventor at Formfactor. The first was granted in 1989 and the most recent in February 2014. Charles A. Miller ranks #6,491 of 4,157,543 US inventors in our database (top 0.16%). Patent records list Charles A. Miller in Spring Grove, PA, US.

Patents per Year

Issued Patents All Time

Showing 1–25 of 147 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8646654	Carton with dispenser	—	2014-02-11
8614590	High performance probe system	—	2013-12-24
8581610	Method of designing an application specific probe card test system	Matthew Chraft, Roy J. Henson	2013-11-12
8513969	Apparatus and method of testing singulated dies	Thomas H. Dozier, II, Benjamin N. Eldridge, David Hsu, Igor Y. Khandros	2013-08-20	$979,000
8324725	Stacked die module	Igor Y. Khandros, Bruce Barbara, Barbara Vasquez	2012-12-04	$1,106,000
8118212	Carton with dispenser	—	2012-02-21
8098076	Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test	Guang Chen, David Pritzkau	2012-01-17	$2,330,000
8067951	Method of expanding tester drive and measurement capability	—	2011-11-29	$2,717,000
7994803	Calibration substrate	—	2011-08-09	$4,439,000
7977958	Bi-directional buffer for interfacing test system channel	—	2011-07-12	$1,702,000
7960990	Closed-grid bus architecture for wafer interconnect structure	John M. Long	2011-06-14	$2,582,000
7952375	AC coupled parameteric test probe	Benjamin N. Eldridge, A. Nicholas Sporck	2011-05-31	$5,633,000
7928750	Contactless interfacing of test signals with a device under test	—	2011-04-19	$2,995,000
7889022	Electromagnetically coupled interconnect system architecture	—	2011-02-15	$2,593,000
7880486	Method and apparatus for increasing operating frequency of a system for testing electronic devices	—	2011-02-01	$2,595,000
7863915	Probe card cooling assembly with direct cooling of active electronic components	—	2011-01-04	$5,053,000
7825652	Method and apparatus for remotely buffering test channels	—	2010-11-02	$1,930,000
7821255	Test system with wireless communications	Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck	2010-10-26	$5,038,000
7768777	Electronic package with direct cooling of active electronic components	—	2010-08-03	$4,322,000
7764075	High performance probe system	—	2010-07-27	$4,153,000
D620353	Wrap around bottle carrier	Steven J. Block, Brad Burlison, Paul Richardson, Raymond L. Zacher	2010-07-27
7746937	Efficient wired interface for differential signals	—	2010-06-29	$2,471,000
7733106	Apparatus and method of testing singulated dies	Thomas H. Dozier, II, Benjamin N. Eldridge, David S. Y. Hsu, Igor Y. Khandros	2010-06-08	$942,000
7714603	Predictive, adaptive power supply for an integrated circuit under test	Benjamin N. Eldridge	2010-05-11	$2,093,000
7699616	High density planar electrical interface	Benjamin N. Eldridge	2010-04-20	$4,441,000