CM

Charles A. Miller

FO Formfactor: 104 patents #4 of 177Top 3%
TZ The C.W. Zumbiel: 19 patents #2 of 18Top 15%
CS Credence Systems: 11 patents #6 of 214Top 3%
AM Amp: 4 patents #288 of 1,260Top 25%
W& Whitaker &: 2 patents #399 of 1,437Top 30%
AO Aol: 1 patents #94 of 253Top 40%
Overall (All Time): #6,499 of 4,157,543Top 1%
147
Patents All Time

Issued Patents All Time

Showing 25 most recent of 147 patents

Patent #TitleCo-InventorsDate
8646654 Carton with dispenser 2014-02-11
8614590 High performance probe system 2013-12-24
8581610 Method of designing an application specific probe card test system Matthew Chraft, Roy J. Henson 2013-11-12
8513969 Apparatus and method of testing singulated dies Thomas H. Dozier, II, Benjamin N. Eldridge, David Hsu, Igor Y. Khandros 2013-08-20
8324725 Stacked die module Igor Y. Khandros, Bruce Barbara, Barbara Vasquez 2012-12-04
8118212 Carton with dispenser 2012-02-21
8098076 Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test Guang Chen, David Pritzkau 2012-01-17
8067951 Method of expanding tester drive and measurement capability 2011-11-29
7994803 Calibration substrate 2011-08-09
7977958 Bi-directional buffer for interfacing test system channel 2011-07-12
7960990 Closed-grid bus architecture for wafer interconnect structure John M. Long 2011-06-14
7952375 AC coupled parameteric test probe Benjamin N. Eldridge, A. Nicholas Sporck 2011-05-31
7928750 Contactless interfacing of test signals with a device under test 2011-04-19
7889022 Electromagnetically coupled interconnect system architecture 2011-02-15
7880486 Method and apparatus for increasing operating frequency of a system for testing electronic devices 2011-02-01
7863915 Probe card cooling assembly with direct cooling of active electronic components 2011-01-04
7825652 Method and apparatus for remotely buffering test channels 2010-11-02
7821255 Test system with wireless communications Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck 2010-10-26
7768777 Electronic package with direct cooling of active electronic components 2010-08-03
7764075 High performance probe system 2010-07-27
D620353 Wrap around bottle carrier Steven J. Block, Brad Burlison, Paul Richardson, Raymond L. Zacher 2010-07-27
7746937 Efficient wired interface for differential signals 2010-06-29
7733106 Apparatus and method of testing singulated dies Thomas H. Dozier, II, Benjamin N. Eldridge, David S. Y. Hsu, Igor Y. Khandros 2010-06-08
7714603 Predictive, adaptive power supply for an integrated circuit under test Benjamin N. Eldridge 2010-05-11
7699616 High density planar electrical interface Benjamin N. Eldridge 2010-04-20