CM

Charles A. Miller

FO Formfactor: 104 patents #4 of 177Top 3%
TZ The C.W. Zumbiel: 19 patents #2 of 18Top 15%
CS Credence Systems: 11 patents #6 of 214Top 3%
AM Amp: 4 patents #288 of 1,260Top 25%
W& Whitaker &: 2 patents #399 of 1,437Top 30%
AO Aol: 1 patents #94 of 253Top 40%
📍 Spring Grove, PA: #1 of 56 inventorsTop 2%
🗺 Pennsylvania: #67 of 74,527 inventorsTop 1%
Overall (All Time): #6,499 of 4,157,543Top 1%
147
Patents All Time

Issued Patents All Time

Showing 26–50 of 147 patents

Patent #TitleCo-InventorsDate
7694246 Test method for yielding a known good die Timothy E. Cooper, Yoshikazu Hatsukano 2010-04-06
7681309 Method for interconnecting an integrated circuit multiple die assembly 2010-03-23
7683738 Adjustable delay transmission line 2010-03-23
7675311 Wireless test system Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck 2010-03-09
7614543 Carton with gravity feed dispenser 2009-11-10
7612630 Electromagnetically coupled interconnect system architecture 2009-11-03
7609080 Voltage fault detection and protection Bruce Barbara 2009-10-27
7595629 Method and apparatus for calibrating and/or deskewing communications channels 2009-09-29
7586300 Isolation buffers with controlled equal time delays 2009-09-08
7583101 Probing structure with fine pitch probes 2009-09-01
7579847 Probe card cooling assembly with direct cooling of active electronic components 2009-08-25
7557592 Method of expanding tester drive and measurement capability 2009-07-07
7550842 Integrated circuit assembly Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck, Gary W. Grube, Gaetan L. Mathieu 2009-06-23
7548055 Testing an electronic device using test data from a plurality of testers Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck 2009-06-16
7540465 Shock absorbing motor mount for vibratory belt drive Roger L. Miller 2009-06-02
7525302 Method of estimating channel bandwidth from a time domain reflectometer (TDR) measurement using rise time and maximum slope Jim Chih-Chiang Tseng 2009-04-28
7508227 Closed-grid bus architecture for wafer interconnect structure John M. Long 2009-03-24
7466157 Contactless interfacing of test signals with a device under test 2008-12-16
7453258 Method and apparatus for remotely buffering test channels 2008-11-18
7443181 High performance probe system 2008-10-28
7433188 Electronic package with direct cooling of active electronic components 2008-10-07
7414418 Method and apparatus for increasing operating frequency of a system for testing electronic devices 2008-08-19
7388424 Apparatus for providing a high frequency loop back with a DC path for a parametric test 2008-06-17
7362092 Isolation buffers with controlled equal time delays 2008-04-22
7342405 Apparatus for reducing power supply noise in an integrated circuit Benjamin N. Eldridge 2008-03-11