Issued Patents All Time
Showing 51–75 of 147 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7335057 | High density planar electrical interface | Benjamin N. Eldridge | 2008-02-26 |
| 7307433 | Intelligent probe card architecture | Matthew Chraft, Roy J. Henson | 2007-12-11 |
| 7276922 | Closed-grid bus architecture for wafer interconnect structure | John M. Long | 2007-10-02 |
| 7262624 | Bi-directional buffer for interfacing test system channel | — | 2007-08-28 |
| 7257796 | Method of incorporating interconnect systems into an integrated circuit process flow | John M. Long | 2007-08-14 |
| 7245134 | Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes | Dane Granicher, Roy J. Henson | 2007-07-17 |
| 7245120 | Predictive, adaptive power supply for an integrated circuit under test | Benjamin N. Eldridge | 2007-07-17 |
| 7245139 | Tester channel to multiple IC terminals | — | 2007-07-17 |
| 7239971 | Method and apparatus for calibrating communications channels | — | 2007-07-03 |
| 7239220 | Adjustable delay transmission line | — | 2007-07-03 |
| 7227371 | High performance probe system | — | 2007-06-05 |
| 7218094 | Wireless test system | Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck | 2007-05-15 |
| 7202687 | Systems and methods for wireless semiconductor device testing | Igor Y. Khandros, Benjamin N. Eldridge, A. Nicholas Sporck | 2007-04-10 |
| 7154259 | Isolation buffers with controlled equal time delays | — | 2006-12-26 |
| 7131848 | Helical microelectronic contact and method for fabricating same | Scott E. Lindsey, David M. Royster, Stuart Wenzel | 2006-11-07 |
| 7108546 | High density planar electrical interface | Benjamin N. Eldridge | 2006-09-19 |
| 7064953 | Electronic package with direct cooling of active electronic components | — | 2006-06-20 |
| 7057474 | Adjustable delay transmission lines | — | 2006-06-06 |
| 7012442 | Test signal distribution system for IC tester | — | 2006-03-14 |
| 7005751 | Layered microelectronic contact and method for fabricating same | Igor Y. Khandros, Stuart Wenzel | 2006-02-28 |
| 7000803 | Contoured carton with dispenser | — | 2006-02-21 |
| 6999987 | Screening and survey selection system and method of operating the same | Michael David Billingsley, Gary Crance, Michael J. Cunningham, Anderson Greene, Edwin Franklin Shaw | 2006-02-14 |
| 6965248 | Compensation for test signal degradation due to DUT fault | — | 2005-11-15 |
| 6965244 | High performance probe system | — | 2005-11-15 |
| 6948940 | Helical microelectronic contact and method for fabricating same | Scott E. Lindsey, David M. Royster, Stuart Wenzel | 2005-09-27 |