Issued Patents All Time
Showing 101–125 of 147 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6559671 | Efficient parallel testing of semiconductor devices using a known good device to generate expected responses | Richard S. Roy | 2003-05-06 |
| 6539531 | Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | John M. Long | 2003-03-25 |
| 6538538 | High frequency printed circuit board via | Emad B. Hreish | 2003-03-25 |
| 6501343 | Integrated circuit tester with high bandwidth probe assembly | — | 2002-12-31 |
| 6499121 | Distributed interface for parallel testing of multiple devices using a single tester channel | Richard S. Roy | 2002-12-24 |
| 6480978 | Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons | Richard S. Roy | 2002-11-12 |
| 6459343 | Integrated circuit interconnect system forming a multi-pole filter | — | 2002-10-01 |
| 6456103 | Apparatus for reducing power supply noise in an integrated circuit | Benjamin N. Eldridge | 2002-09-24 |
| 6452411 | Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses | Richard S. Roy | 2002-09-17 |
| 6448865 | Integrated circuit interconnect system | — | 2002-09-10 |
| 6341692 | Carton carrier | — | 2002-01-29 |
| 6339338 | Apparatus for reducing power supply noise in an integrated circuit | Benjamin N. Eldridge | 2002-01-15 |
| 6218910 | High bandwidth passive integrated circuit tester probe card assembly | — | 2001-04-17 |
| 6208225 | Filter structures for integrated circuit interfaces | — | 2001-03-27 |
| 6137346 | Temperature tracking voltage to current converter | — | 2000-10-24 |
| 6105773 | Carton carrier | — | 2000-08-22 |
| 6105157 | Salphasic timing calibration system for an integrated circuit tester | — | 2000-08-15 |
| 6078187 | Hemispherical test head for integrated circuit tester employing radially distributed circuit cards | John C. Hanners | 2000-06-20 |
| 6040691 | Test head for integrated circuit tester arranging tester component circuit boards on three dimensions | John C. Hanners, Dean Allen Stanford | 2000-03-21 |
| 5986447 | Test head structure for integrated circuit tester | John C. Hanners, Dean Allen Stanford | 1999-11-16 |
| D415423 | Long neck bottle carton | Norbert Hoell | 1999-10-19 |
| 5966033 | Low ripple phase detector | — | 1999-10-12 |
| 5947367 | Sleeve style bottle carton | Norbert Hoell | 1999-09-07 |
| 5944253 | Sleeve style bottle carton | Norbert Hoell | 1999-08-31 |
| 5832468 | Method for improving process control by reducing lag time of sensors using artificial neural networks | Paul Lemieux, Paul J. Chappell, Ronald L. Capone, Keith Joseph Fritsky | 1998-11-03 |