Issued Patents All Time
Showing 76–100 of 147 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6949942 | Predictive, adaptive power supply for an integrated circuit under test | Benjamin N. Eldridge | 2005-09-27 |
| 6917210 | Integrated circuit tester with high bandwidth probe assembly | — | 2005-07-12 |
| 6910268 | Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via | — | 2005-06-28 |
| 6911814 | Apparatus and method for electromechanical testing and validation of probe cards | Emad B. Hreish | 2005-06-28 |
| 6911835 | High performance probe system | Matthew Chraft, Roy J. Henson, Chih-Chiang Tseng | 2005-06-28 |
| 6891385 | Probe card cooling assembly with direct cooling of active electronic components | — | 2005-05-10 |
| 6882239 | Electromagnetically coupled interconnect system | — | 2005-04-19 |
| 6882546 | Multiple die interconnect system | — | 2005-04-19 |
| 6845491 | Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | John M. Long | 2005-01-18 |
| 6822529 | Integrated circuit interconnect system | — | 2004-11-23 |
| 6816031 | Adjustable delay transmission line | — | 2004-11-09 |
| 6812691 | Compensation for test signal degradation due to DUT fault | — | 2004-11-02 |
| 6798225 | Tester channel to multiple IC terminals | — | 2004-09-28 |
| 6784677 | Closed-grid bus architecture for wafer interconnect structure | John M. Long | 2004-08-31 |
| 6784674 | Test signal distribution system for IC tester | — | 2004-08-31 |
| 6686754 | Integrated circuit tester with high bandwidth probe assembly | — | 2004-02-03 |
| 6680659 | Integrated circuit interconnect system | — | 2004-01-20 |
| 6678850 | Distributed interface for parallel testing of multiple devices using a single tester channel | Richard S. Roy | 2004-01-13 |
| 6661316 | High frequency printed circuit board via | Emad B. Hreish | 2003-12-09 |
| 6657455 | Predictive, adaptive power supply for an integrated circuit under test | Benjamin N. Eldridge | 2003-12-02 |
| 6646520 | Integrated circuit interconnect system | — | 2003-11-11 |
| 6622103 | System for calibrating timing of an integrated circuit wafer tester | — | 2003-09-16 |
| 6606014 | Filter structures for integrated circuit interfaces | — | 2003-08-12 |
| 6606575 | Cross-correlation timing calibration for wafer-level IC tester interconnect systems | — | 2003-08-12 |
| 6603323 | Closed-grid bus architecture for wafer interconnect structure | John M. Long | 2003-08-05 |