| 7952375 |
AC coupled parameteric test probe |
Benjamin N. Eldridge, Charles A. Miller |
2011-05-31 |
| 7852094 |
Sharing resources in a system for testing semiconductor devices |
Matthew Chraft, Benjamin N. Eldridge, Roy J. Henson |
2010-12-14 |
| 7821255 |
Test system with wireless communications |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller |
2010-10-26 |
| 7675311 |
Wireless test system |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller |
2010-03-09 |
| 7659736 |
Mechanically reconfigurable vertical tester interface for IC probing |
Benjamin N. Eldridge, Barbara Vasquez, Makarand Shinde, Gaetan L. Mathieu |
2010-02-09 |
| 7649366 |
Method and apparatus for switching tester resources |
Roy J. Henson |
2010-01-19 |
| 7616016 |
Probe card assembly and kit |
Benjamin N. Eldridge, Igor Y. Khandros |
2009-11-10 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde +2 more |
2009-09-22 |
| 7550842 |
Integrated circuit assembly |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller, Gary W. Grube, Gaetan L. Mathieu |
2009-06-23 |
| 7548055 |
Testing an electronic device using test data from a plurality of testers |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller |
2009-06-16 |
| 7352196 |
Probe card assembly and kit |
Igor Y. Khandros, Benjamin N. Eldridge |
2008-04-01 |
| 7285968 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde +2 more |
2007-10-23 |
| 7230437 |
Mechanically reconfigurable vertical tester interface for IC probing |
Benjamin N. Eldridge, Barbara Vasquez, Makarand Shinde, Gaetan L. Mathieu |
2007-06-12 |
| 7218094 |
Wireless test system |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller |
2007-05-15 |
| 7202687 |
Systems and methods for wireless semiconductor device testing |
Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller |
2007-04-10 |
| 7064566 |
Probe card assembly and kit |
Igor Y. Khandros, Benjamin N. Eldridge |
2006-06-20 |
| 7061257 |
Probe card assembly |
Igor Y. Khandros, Benjamin N. Eldridge |
2006-06-13 |
| 6856150 |
Probe card with coplanar daughter card |
Makarand Shinde |
2005-02-15 |
| 6838893 |
Probe card assembly |
Igor Y. Khandros, Benjamin N. Eldridge |
2005-01-04 |
| 5867033 |
Circuit for testing the operation of a semiconductor device |
Paul Torgerson, Roy J. Henson |
1999-02-02 |
| 5646406 |
Stroboscopic photometer |
Heng-Yang Lin |
1997-07-08 |
