| 7845072 |
Method and apparatus for adjusting a multi-substrate probe structure |
Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy +1 more |
2010-12-07 |
$5,601,000 |
| 7825674 |
Probe card configuration for low mechanical flexural strength electrical routing substrates |
Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy, Benjamin N. Eldridge |
2010-11-02 |
$1,930,000 |
| 7692433 |
Sawing tile corners on probe card substrates |
Benjamin N. Eldridge, Roy J. Henson, Eric D. Hobbs, Peter B. Mathews |
2010-04-06 |
$3,995,000 |
| 7671614 |
Apparatus and method for adjusting an orientation of probes |
Benjamin N. Eldridge, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum |
2010-03-02 |
$7,585,000 |
| 7659736 |
Mechanically reconfigurable vertical tester interface for IC probing |
Benjamin N. Eldridge, Barbara Vasquez, Gaetan L. Mathieu, A. Nicholas Sporck |
2010-02-09 |
$3,704,000 |
| 7642794 |
Method and system for compensating thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu |
2010-01-05 |
$9,375,000 |
| 7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum +2 more |
2009-09-22 |
$6,869,000 |
| 7560941 |
Method and system for compensating thermally induced motion of probe cards |
Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more |
2009-07-14 |
$6,170,000 |
| 7471094 |
Method and apparatus for adjusting a multi-substrate probe structure |
Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy +1 more |
2008-12-30 |
$4,196,000 |
| 7312618 |
Method and system for compensating thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu |
2007-12-25 |
|
| 7285968 |
Apparatus and method for managing thermally induced motion of a probe card assembly |
Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum +2 more |
2007-10-23 |
$11,950,000 |
| 7230437 |
Mechanically reconfigurable vertical tester interface for IC probing |
Benjamin N. Eldridge, Barbara Vasquez, Gaetan L. Mathieu, A. Nicholas Sporck |
2007-06-12 |
$20,606,000 |
| 7119564 |
Method and system for compensating thermally induced motion of probe cards |
Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more |
2006-10-10 |
$27,056,000 |
| 7116119 |
Probe card with coplanar daughter card |
Alistair Nicholas Sporck |
2006-10-03 |
$26,710,000 |
| 7071714 |
Method and system for compensating for thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu |
2006-07-04 |
|
| 7071715 |
Probe card configuration for low mechanical flexural strength electrical routing substrates |
Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy, Benjamin N. Eldridge |
2006-07-04 |
|
| 6972578 |
Method and system for compensating thermally induced motion of probe cards |
Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more |
2005-12-06 |
$10,759,000 |
| 6856150 |
Probe card with coplanar daughter card |
A. Nicholas Sporck |
2005-02-15 |
$8,493,000 |