Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7845072 | Method and apparatus for adjusting a multi-substrate probe structure | Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy +1 more | 2010-12-07 |
| 7825674 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy, Benjamin N. Eldridge | 2010-11-02 |
| 7692433 | Sawing tile corners on probe card substrates | Benjamin N. Eldridge, Roy J. Henson, Eric D. Hobbs, Peter B. Mathews | 2010-04-06 |
| 7671614 | Apparatus and method for adjusting an orientation of probes | Benjamin N. Eldridge, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum | 2010-03-02 |
| 7659736 | Mechanically reconfigurable vertical tester interface for IC probing | Benjamin N. Eldridge, Barbara Vasquez, Gaetan L. Mathieu, A. Nicholas Sporck | 2010-02-09 |
| 7642794 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu | 2010-01-05 |
| 7592821 | Apparatus and method for managing thermally induced motion of a probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum +2 more | 2009-09-22 |
| 7560941 | Method and system for compensating thermally induced motion of probe cards | Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more | 2009-07-14 |
| 7471094 | Method and apparatus for adjusting a multi-substrate probe structure | Eric D. Hobbs, Benjamin N. Eldridge, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy +1 more | 2008-12-30 |
| 7312618 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu | 2007-12-25 |
| 7285968 | Apparatus and method for managing thermally induced motion of a probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Alexander H. Slocum +2 more | 2007-10-23 |
| 7230437 | Mechanically reconfigurable vertical tester interface for IC probing | Benjamin N. Eldridge, Barbara Vasquez, Gaetan L. Mathieu, A. Nicholas Sporck | 2007-06-12 |
| 7119564 | Method and system for compensating thermally induced motion of probe cards | Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more | 2006-10-10 |
| 7116119 | Probe card with coplanar daughter card | Alistair Nicholas Sporck | 2006-10-03 |
| 7071714 | Method and system for compensating for thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Gaetan L. Mathieu | 2006-07-04 |
| 7071715 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy, Benjamin N. Eldridge | 2006-07-04 |
| 6972578 | Method and system for compensating thermally induced motion of probe cards | Rod Martens, Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder +1 more | 2005-12-06 |
| 6856150 | Probe card with coplanar daughter card | A. Nicholas Sporck | 2005-02-15 |