| 8889997 |
Methods for improving corrosion resistance and applications in electrical connectors |
Zhengwei Liu, Min Zheng |
2014-11-18 |
| 7868632 |
Composite motion probing |
Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu |
2011-01-11 |
| 7731503 |
Carbon nanotube contact structures |
Benjamin N. Eldridge, John K. Gritters, Igor Y. Khandros, Gaetan L. Mathieu |
2010-06-08 |
| 7701243 |
Electronic device testing using a probe tip having multiple contact features |
Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu |
2010-04-20 |
| 7560941 |
Method and system for compensating thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more |
2009-07-14 |
| 7463043 |
Methods of probing an electronic device |
Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu |
2008-12-09 |
| 7218127 |
Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component |
Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu |
2007-05-15 |
| 7202682 |
Composite motion probing |
Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu |
2007-04-10 |
| 7119564 |
Method and system for compensating thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more |
2006-10-10 |
| 6972578 |
Method and system for compensating thermally induced motion of probe cards |
Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more |
2005-12-06 |