Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8889997 | Methods for improving corrosion resistance and applications in electrical connectors | Zhengwei Liu, Min Zheng | 2014-11-18 |
| 7868632 | Composite motion probing | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2011-01-11 |
| 7731503 | Carbon nanotube contact structures | Benjamin N. Eldridge, John K. Gritters, Igor Y. Khandros, Gaetan L. Mathieu | 2010-06-08 |
| 7701243 | Electronic device testing using a probe tip having multiple contact features | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2010-04-20 |
| 7560941 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more | 2009-07-14 |
| 7463043 | Methods of probing an electronic device | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2008-12-09 |
| 7218127 | Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2007-05-15 |
| 7202682 | Composite motion probing | Timothy E. Cooper, Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2007-04-10 |
| 7119564 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more | 2006-10-10 |
| 6972578 | Method and system for compensating thermally induced motion of probe cards | Benjamin N. Eldridge, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more | 2005-12-06 |