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Composite motion probing |
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2011-01-11 |
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Probe card configuration for low mechanical flexural strength electrical routing substrates |
Makarand Shinde, Richard A. Larder, Ravindra V. Shenoy, Benjamin N. Eldridge |
2010-11-02 |
| 7701243 |
Electronic device testing using a probe tip having multiple contact features |
Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu |
2010-04-20 |
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Test method for yielding a known good die |
Charles A. Miller, Yoshikazu Hatsukano |
2010-04-06 |
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Apparatus and method for limiting over travel in a probe card assembly |
Benjamin N. Eldridge, Carl V. Reynolds, Ravindra V. Shenoy |
2009-01-27 |
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Methods of probing an electronic device |
Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu |
2008-12-09 |
| 7218127 |
Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component |
Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu |
2007-05-15 |
| 7202682 |
Composite motion probing |
Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu |
2007-04-10 |
| 7084650 |
Apparatus and method for limiting over travel in a probe card assembly |
Benjamin N. Eldridge, Carl V. Reynolds, Ravindra V. Shenoy |
2006-08-01 |
| 7071715 |
Probe card configuration for low mechanical flexural strength electrical routing substrates |
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