Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7868632 | Composite motion probing | Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2011-01-11 |
| 7825674 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Makarand Shinde, Richard A. Larder, Ravindra V. Shenoy, Benjamin N. Eldridge | 2010-11-02 |
| 7701243 | Electronic device testing using a probe tip having multiple contact features | Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2010-04-20 |
| 7694246 | Test method for yielding a known good die | Charles A. Miller, Yoshikazu Hatsukano | 2010-04-06 |
| 7482822 | Apparatus and method for limiting over travel in a probe card assembly | Benjamin N. Eldridge, Carl V. Reynolds, Ravindra V. Shenoy | 2009-01-27 |
| 7463043 | Methods of probing an electronic device | Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2008-12-09 |
| 7218127 | Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component | Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2007-05-15 |
| 7202682 | Composite motion probing | Benjamin N. Eldridge, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2007-04-10 |
| 7084650 | Apparatus and method for limiting over travel in a probe card assembly | Benjamin N. Eldridge, Carl V. Reynolds, Ravindra V. Shenoy | 2006-08-01 |
| 7071715 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Makarand Shinde, Richard A. Larder, Ravindra V. Shenoy, Benjamin N. Eldridge | 2006-07-04 |