Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8098076 | Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test | Guang Chen, Charles A. Miller | 2012-01-17 |
| 7936177 | Providing an electrically conductive wall structure adjacent a contact structure of an electronic device | Keith J. Breinlinger, Benjamin N. Eldridge | 2011-05-03 |