| 12163999 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2024-12-10 |
| 11860221 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2024-01-02 |
| 11255903 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2022-02-22 |
| 10852347 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2020-12-01 |
| 10094872 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2018-10-09 |
| 9316683 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2016-04-19 |
| 9151797 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2015-10-06 |
| 8747123 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2014-06-10 |
| 8628336 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2014-01-14 |
| 8506335 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2013-08-13 |
| 8388357 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2013-03-05 |
| 8118618 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more |
2012-02-21 |
| 7762822 |
Apparatus for testing electronic devices |
Donald P. Richmond, II, Kenneth W. Deboe, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +1 more |
2010-07-27 |
| 7541822 |
Wafer burn-in and text employing detachable cartridge |
John Andberg, Mark C. Carbone, Donald P. Richmond, II |
2009-06-02 |
| 7301358 |
Contactor assembly for testing electrical circuits |
Jovan Jovanovic, Donald P. Richmond, II |
2007-11-27 |
| 7088117 |
Wafer burn-in and test employing detachable cartridge |
John Andberg, Mark C. Carbone, Donald P. Richmond, II |
2006-08-08 |
| 6853209 |
Contactor assembly for testing electrical circuits |
Jovan Jovanovic, Donald P. Richmond, II |
2005-02-08 |
| 6580283 |
Wafer level burn-in and test methods |
Mark C. Carbone, John Andberg, Jerzy Lobacz, Donald P. Richmond, II |
2003-06-17 |
| 6556032 |
Wafer-burn-in and test employing detachable cartridge |
John Andberg, Mark C. Carbone, Donald P. Richmond, II |
2003-04-29 |
| 6413113 |
Kinematic coupling |
John Andberg, Mark C. Carbone, Donald P. Richmond, II |
2002-07-02 |
| 6340895 |
Wafer-level burn-in and test cartridge |
John Andberg, Mark C. Carbone, Donald P. Richmond, II |
2002-01-22 |
| 5447570 |
Purge gas in wafer coating area selection |
Johannes Schmitz, Frederick J. Scholz, Norman L. Turner, Raymond L. Chow, Sien G. Kang +1 more |
1995-09-05 |
| 5387289 |
Film uniformity by selective pressure gradient control |
Johannes Schmitz, Raymond L. Chow, Sien G. Kang, Edward J. Rode |
1995-02-07 |