Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12292484 | Method and system for thermal control of devices in an electronics tester | Jovan Jovanovic, Kenneth W. Deboe | 2025-05-06 |
| 12265136 | Method and system for thermal control of devices in electronics tester | Jovan Jovanovic, Kenneth W. Deboe | 2025-04-01 |
| 12169217 | Electronics tester | Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey | 2024-12-17 |
| 12007451 | Method and system for thermal control of devices in an electronics tester | Jovan Jovanovic, Kenneth W. Deboe | 2024-06-11 |
| 11821940 | Electronics tester | Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey | 2023-11-21 |
| 11635459 | Electronics tester | Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey | 2023-04-25 |
| 11209497 | Method and system for thermal control of devices in an electronics tester | Jovan Jovanovic, Kenneth W. Deboe | 2021-12-28 |
| 11199572 | Electronics tester | Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey | 2021-12-14 |
| 10976362 | Electronics tester with power saving state | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2021-04-13 |
| 10718808 | Electronics tester with current amplification | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2020-07-21 |
| 10649022 | Electronics tester | Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey | 2020-05-12 |
| D875579 | Layout of contacts | Jovan Jovanovic, Scott E. Lindsey, David S. Hendrickson | 2020-02-18 |
| 10466292 | Method and system for thermal control of devices in an electronics tester | Jovan Jovanovic, Kenneth W. Deboe | 2019-11-05 |
| D850309 | Layout of contacts | Jovan Jovanovic, Scott E. Lindsey, David S. Hendrickson | 2019-06-04 |
| 10151793 | Electronics tester with double-spiral thermal control passage in a thermal chuck | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2018-12-11 |
| 9857418 | Electronics tester with group and individual current configurations | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2018-01-02 |
| 9500702 | Electronics tester with hot fluid thermal control | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2016-11-22 |
| 9291668 | Electronics tester with a valve integrally formed in a component of a portable pack | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2016-03-22 |
| 9086449 | Adhesively attached stand-offs on a portable pack for an electronics tester | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2015-07-21 |
| 8198909 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2012-06-12 |
| 7902846 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2011-03-08 |
| 7667475 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon | 2010-02-23 |
| 4858111 | Write-back cache system using concurrent address transfers to setup requested address in main memory before dirty miss signal from cache | — | 1989-08-15 |
| 4724518 | Odd/even storage in cache memory | — | 1988-02-09 |
| 4654787 | Apparatus for locating memory modules having different sizes within a memory space | James S. Finnell | 1987-03-31 |