| 12292484 |
Method and system for thermal control of devices in an electronics tester |
Jovan Jovanovic, Kenneth W. Deboe |
2025-05-06 |
| 12265136 |
Method and system for thermal control of devices in electronics tester |
Jovan Jovanovic, Kenneth W. Deboe |
2025-04-01 |
| 12169217 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey |
2024-12-17 |
| 12007451 |
Method and system for thermal control of devices in an electronics tester |
Jovan Jovanovic, Kenneth W. Deboe |
2024-06-11 |
| 11821940 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey |
2023-11-21 |
| 11635459 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey |
2023-04-25 |
| 11209497 |
Method and system for thermal control of devices in an electronics tester |
Jovan Jovanovic, Kenneth W. Deboe |
2021-12-28 |
| 11199572 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey |
2021-12-14 |
| 10976362 |
Electronics tester with power saving state |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2021-04-13 |
| 10718808 |
Electronics tester with current amplification |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2020-07-21 |
| 10649022 |
Electronics tester |
Jovan Jovanovic, Kenneth W. Deboe, Scott E. Lindsey |
2020-05-12 |
| D875579 |
Layout of contacts |
Jovan Jovanovic, Scott E. Lindsey, David S. Hendrickson |
2020-02-18 |
| 10466292 |
Method and system for thermal control of devices in an electronics tester |
Jovan Jovanovic, Kenneth W. Deboe |
2019-11-05 |
| D850309 |
Layout of contacts |
Jovan Jovanovic, Scott E. Lindsey, David S. Hendrickson |
2019-06-04 |
| 10151793 |
Electronics tester with double-spiral thermal control passage in a thermal chuck |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2018-12-11 |
| 9857418 |
Electronics tester with group and individual current configurations |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2018-01-02 |
| 9500702 |
Electronics tester with hot fluid thermal control |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2016-11-22 |
| 9291668 |
Electronics tester with a valve integrally formed in a component of a portable pack |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2016-03-22 |
| 9086449 |
Adhesively attached stand-offs on a portable pack for an electronics tester |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2015-07-21 |
| 8198909 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2012-06-12 |
| 7902846 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2011-03-08 |
| 7667475 |
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion |
Scott E. Lindsey, Kenneth W. Deboe, Donald P. Richmond, II, Alberto Calderon |
2010-02-23 |
| 4858111 |
Write-back cache system using concurrent address transfers to setup requested address in main memory before dirty miss signal from cache |
— |
1989-08-15 |
| 4724518 |
Odd/even storage in cache memory |
— |
1988-02-09 |
| 4654787 |
Apparatus for locating memory modules having different sizes within a memory space |
James S. Finnell |
1987-03-31 |