Issued Patents All Time
Showing 26–50 of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8228085 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson | 2012-07-24 |
| 8198909 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon | 2012-06-12 |
| 8118618 | Apparatus for testing electronic devices | Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +7 more | 2012-02-21 |
| 7969175 | Separate test electronics and blower modules in an apparatus for testing an integrated circuit | David S. Hendrickson, Jovan Jovanovic, William D. Barraclough | 2011-06-28 |
| 7928754 | Wafer level burn-in and electrical test system and method | John Hoang, Jerzy Lobacz | 2011-04-19 |
| 7902846 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon | 2011-03-08 |
| 7800382 | System for testing an integrated circuit of a device and its method of use | Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson | 2010-09-21 |
| 7762822 | Apparatus for testing electronic devices | Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner +1 more | 2010-07-27 |
| 7667475 | Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion | Steven C. Steps, Scott E. Lindsey, Kenneth W. Deboe, Alberto Calderon | 2010-02-23 |
| 7619428 | Wafer level burn-in and electrical test system and method | John Hoang, Jerzy Lobacz | 2009-11-17 |
| 7541822 | Wafer burn-in and text employing detachable cartridge | Frank O. Uher, John Andberg, Mark C. Carbone | 2009-06-02 |
| 7511521 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Jovan Jovanovic | 2009-03-31 |
| 7385407 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Jovan Jovanovic | 2008-06-10 |
| 7301358 | Contactor assembly for testing electrical circuits | Jovan Jovanovic, Frank O. Uher | 2007-11-27 |
| 7088117 | Wafer burn-in and test employing detachable cartridge | Frank O. Uher, John Andberg, Mark C. Carbone | 2006-08-08 |
| 7046022 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Jovan Jovanovic | 2006-05-16 |
| 6867608 | Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component | Jovan Jovanovic | 2005-03-15 |
| 6853209 | Contactor assembly for testing electrical circuits | Jovan Jovanovic, Frank O. Uher | 2005-02-08 |
| 6682945 | Wafer level burn-in and electrical test system and method | John Hoang, Jerzy Lobacz | 2004-01-27 |
| 6580283 | Wafer level burn-in and test methods | Mark C. Carbone, Frank O. Uher, John Andberg, Jerzy Lobacz | 2003-06-17 |
| 6562636 | Wafer level burn-in and electrical test system and method | John Hoang, Jerry Lobacz | 2003-05-13 |
| 6556032 | Wafer-burn-in and test employing detachable cartridge | Frank O. Uher, John Andberg, Mark C. Carbone | 2003-04-29 |
| 6413113 | Kinematic coupling | Frank O. Uher, John Andberg, Mark C. Carbone | 2002-07-02 |
| 6355981 | Wafer fabrication of inside-wrapped contacts for electronic devices | John G. Richards, Wendell B. Sander | 2002-03-12 |
| 6340895 | Wafer-level burn-in and test cartridge | Frank O. Uher, John Andberg, Mark C. Carbone | 2002-01-22 |