JK

January Kister

MI Microprobe: 26 patents #1 of 20Top 5%
FO Formfactor: 11 patents #18 of 177Top 15%
PT Probe Technology: 9 patents #1 of 3Top 35%
KI Kulicke & Soffa Investments: 6 patents #5 of 108Top 5%
AC Antares Contech: 4 patents #1 of 6Top 20%
MI Micropore: 1 patents #7 of 11Top 65%
SP Sv Probe Pte.: 1 patents #19 of 44Top 45%
Overall (All Time): #34,768 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 25 most recent of 64 patents

Patent #TitleCo-InventorsDate
11293947 Probe on carrier architecture for vertical probe arrays Mukesh Selvaraj 2022-04-05
11156640 MEMS probe card assembly having decoupled electrical and mechanical probe connections Mukesh Selvaraj 2021-10-26
11156637 Electrical test probes having decoupled electrical and mechanical design Roy E. Swart, Edin Sijercic 2021-10-26
11054443 Probe tip with embedded skate Chun-Chih Wang 2021-07-06
RE46221 Probe skates for electrical testing of convex pad topologies 2016-11-29
9476911 Probes with high current carrying capability and laser machining methods 2016-10-25
9316670 Multiple contact probes 2016-04-19
9310428 Probe retention arrangement Alex Shtarker 2016-04-12
9274143 Vertical probe array arranged to provide space transformation 2016-03-01
9250266 Probe bonding method having improved control of bonding material 2016-02-02
9121868 Probes with offset arm and suspension structure 2015-09-01
9097740 Layered probes with core 2015-08-04
8988091 Multiple contact probes 2015-03-24
8907689 Probe retention arrangement Alex Shtarker 2014-12-09
8829937 Fine pitch guided vertical probe array having enclosed probe flexures 2014-09-09
8723546 Vertical guided layered probe 2014-05-13
RE44407 Space transformers employing wire bonds for interconnections with fine pitch contacts 2013-08-06
8415963 Low profile probe having improved mechanical scrub and reduced contact inductance 2013-04-09
8324923 Vertical probe array arranged to provide space transformation 2012-12-04
8230593 Probe bonding method having improved control of bonding material 2012-07-31
RE43503 Probe skates for electrical testing of convex pad topologies 2012-07-10
8203353 Probes with offset arm and suspension structure 2012-06-19
8111080 Knee probe having reduced thickness section for control of scrub motion 2012-02-07
7952377 Vertical probe array arranged to provide space transformation 2011-05-31
7944224 Low profile probe having improved mechanical scrub and reduced contact inductance 2011-05-17