Issued Patents All Time
Showing 51–64 of 64 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6530148 | Method for making a probe apparatus for testing integrated circuits | — | 2003-03-11 |
| 6525552 | Modular probe apparatus | — | 2003-02-25 |
| 6424164 | Probe apparatus having removable beam probes | — | 2002-07-23 |
| 6419500 | Probe assembly having floatable buckling beam probes and apparatus for abrading the same | — | 2002-07-16 |
| 6420887 | Modulated space transformer for high density buckling beam probe and method for making the same | Jean-Michel Jurin, Isabelle George | 2002-07-16 |
| 6204674 | Assembly structure for making integrated circuit chip probe cards | Krzysztof Dabrowiecki | 2001-03-20 |
| 6064215 | High temperature probe card for testing integrated circuits | — | 2000-05-16 |
| 5884395 | Assembly structure for making integrated circuit chip probe cards | Krzysztof Dabrowiecki, Jerzy Lobacz | 1999-03-23 |
| 5764072 | Dual contact probe assembly for testing integrated circuits | — | 1998-06-09 |
| 5751157 | Method and apparatus for aligning probes | — | 1998-05-12 |
| 5742174 | Membrane for holding a probe tip in proper location | Jerzy Lobacz | 1998-04-21 |
| 5720098 | Method for making a probe preserving a uniform stress distribution under deflection | — | 1998-02-24 |
| 5644249 | Method and circuit testing apparatus for equalizing a contact force between probes and pads | — | 1997-07-01 |
| 5422574 | Large scale protrusion membrane for semiconductor devices under test with very high pin counts | — | 1995-06-06 |