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Electrical test probes having decoupled electrical and mechanical design |
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Manufacturing advanced test probes |
Paul B. Fischer, Charlotte C. Kwong |
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Probe head assemblies and probe systems for testing integrated circuit devices |
Jay Scott Salmon, Brandon Liew |
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Liquid metal interconnects |
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Interposer to regulate current for wafer test tooling |
Evan M. Fledell, Paul B. Fischer, Timothy J. Maloney, Jack D. Pippin |
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Increasing current carrying capability through direct liquid cooling of test contacts |
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Test probe structures and methods including positioning test probe structures in a test head |
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Method and arrangement for supplying a waste heat exchanger with exhaust gas from a gas turbine |
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