Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11621808 | Machine learning based methodology for signal waveform, eye diagram, and bit error rate (BER) bathtub prediction | Shuo Jiao, Bowen Li | 2023-04-04 |
| 11423303 | Machine learning based methodology for adaptative equalization | Shuo Jiao, Bowen Li, Geoffrey Zhang | 2022-08-23 |
| 9377802 | Dynamic configuration of equivalent series resistance | Christopher P. Wyland, Paul Ying-Fung Wu | 2016-06-28 |
| 8925193 | Methods for fabricating circuit boards | — | 2015-01-06 |
| 8710623 | Integrated circuit having a discrete capacitor mounted on a semiconductor die | Mark A. Alexander, Howard Johnson | 2014-04-29 |
| 8410579 | Power distribution network | Atul V. Ghia, Christopher P. Wyland, Ketan Sodha, Paul T. Sasaki, Jian Tan +1 more | 2013-04-02 |
| 8305098 | Element usable with the method, and a standalone probe card tester formable using the method | — | 2012-11-06 |
| 8269515 | High impedance, high parallelism, high temperature memory test system architecture | — | 2012-09-18 |
| 7859277 | Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array | Pam Stellmacher, Edmundo Dela Puente, John Andberg | 2010-12-28 |
| 7768278 | High impedance, high parallelism, high temperature memory test system architecture | — | 2010-08-03 |
| 7750650 | Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry | — | 2010-07-06 |
| 7541824 | Forced air cooling of components on a probecard | John Andberg | 2009-06-02 |
| 7502974 | Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets | Preeti Garg, Mike Augustin | 2009-03-10 |
| 7501844 | Liquid cooled DUT card interface for wafer sort probing | John Andberg | 2009-03-10 |
| 7460371 | Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sink | John Andberg | 2008-12-02 |
| 7459921 | Method and apparatus for a paddle board probe card | John Andberg | 2008-12-02 |
| 7348791 | High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch design | — | 2008-03-25 |
| 7323897 | Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment | — | 2008-01-29 |
| 7147499 | Zero insertion force printed circuit assembly connector system and method | John Andberg, Don Chiu, Noriyuki Sugihara | 2006-12-12 |
| 7106081 | Parallel calibration system for a test device | Todd Sholl, Nasser Jafari, Andrew C. S. Tse, Randy L. Bailey | 2006-09-12 |
| 6570397 | Timing calibration and timing calibration verification of electronic circuit testers | Noriyuki Sugihara, Andrew C. S. Tse, Randy L. Bailey | 2003-05-27 |