Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8992833 | System and method for multi-analyte detection | Lawrence Blecka, Larry Seamer, Sachi Rastogi, Chris Tsai, Ken J. Lafredo | 2015-03-31 |
| 8449687 | Wash ring assembly and method of use | Lawrence Blecka, Chris Tsai | 2013-05-28 |
| 8357537 | System and method for multi-analyte detection | Lawrence Blecka, Larry Seamer, Sachi Rastogi, Chris Tsai, Ken J. Lafredo | 2013-01-22 |
| 8136539 | Wash ring assembly and method of use | Lawrence Blecka, Chris Tsai | 2012-03-20 |
| 8012768 | System and method for multi-analyte detection | Chan Chun Chung Patrick, Lawrence Blecka, Chris Tsai | 2011-09-06 |
| 7955555 | System and method for multi-analyte detection | Lawrence Blecka, Larry Seamer, Sachi Rastogi, Chris Tsai, Ken J. Lafredo | 2011-06-07 |
| 7220385 | System and method for multi-analyte detection | Lawrence Blecka, Larry Seamer, Sachi Rastogi, Chris Tsai, Ken J. Lafredo | 2007-05-22 |
| 7106081 | Parallel calibration system for a test device | Romi Mayder, Todd Sholl, Andrew C. S. Tse, Randy L. Bailey | 2006-09-12 |
| 7000785 | Tube rack accommodating a range of tube diameters | Lawrence Blecka | 2006-02-21 |
| 6794889 | Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing | Kenneth D. Karklin, William Sprague | 2004-09-21 |