Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9176169 | Probe apparatus and test apparatus | — | 2015-11-03 |
| 8922232 | Test-use individual substrate, probe, and semiconductor wafer testing apparatus | Shigeru Matsumura, Kohei Kato, Koichi Shiroyama, Mitsutoshi Higashi, Akinori Shiraishi +1 more | 2014-12-30 |
| 8779791 | Method of manufacturing probe having boards connected by magnets | Yoshiharu Umemura | 2014-07-15 |