SM

Shigeru Matsumura

AD Advantest: 26 patents #15 of 1,193Top 2%
YS Yokogawa Medical Systems: 4 patents #13 of 55Top 25%
HH Hirakawa Hewtech: 2 patents #2 of 16Top 15%
Kyocera: 1 patents #2,054 of 3,732Top 60%
SC Shinko Electric Industries Co.: 1 patents #437 of 723Top 65%
SC Shoei Chemical: 1 patents #72 of 128Top 60%
TG Tyco Electronics Japan G.K.: 1 patents #122 of 248Top 50%
YE Yokogawa Electric: 1 patents #658 of 1,441Top 50%
YE Yokogawa Hokushin Electric: 1 patents #34 of 112Top 35%
GE: 1 patents #19,878 of 36,430Top 55%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
AC Aisin Aw Co.: 1 patents #1,133 of 2,011Top 60%
Aisin Seiki Kabushiki Kaisha: 1 patents #2,094 of 3,782Top 60%
Overall (All Time): #94,559 of 4,157,543Top 3%
36
Patents All Time

Issued Patents All Time

Showing 1–25 of 36 patents

Patent #TitleCo-InventorsDate
9242637 Vehicle control system Tomohiko Miyamoto, Noriyuki Yagi, Kenjiro Nagata, Masatoshi Sugimoto 2016-01-26
8922232 Test-use individual substrate, probe, and semiconductor wafer testing apparatus Kohei Kato, Katsushi Sugai, Koichi Shiroyama, Mitsutoshi Higashi, Akinori Shiraishi +1 more 2014-12-30
8212579 Fixing apparatus for a probe card Yoshihiro Abe 2012-07-03
8134381 Connection board, probe card, and electronic device test apparatus comprising same Yoshihiro Abe, Takaji Ishikawa, Noriaki Shimasaki 2012-03-13
7690944 Connector assembly, receptacle type connector, and interface apparatus Kazutaka Osawa, Hiroyuki Hama, Yuichiro Izumi, Eiichiro Takemasa 2010-04-06
7611377 Interface apparatus for electronic device test apparatus Kazutaka Osawa, Hiroyuki Hama, Yuichiro Izumi 2009-11-03
7484285 System for mating and demating multiple connectors mounted on board of semiconductor test apparatus Masanori Kaneko, Hiroyuki Hama, Takaji Ishikawa 2009-02-03
7474109 Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus Tetsuya Kuitani, Tadao Saito, Shin Sakiyama 2009-01-06
7373186 Folding-type portable information device provided with image capturing function Takaaki Watanabe, Seiji Horii 2008-05-13
7355123 Foam coaxial cable and method of manufacturing the same Hiroyuki Kimura, Mitsuo Iwasaki, Shigeru Murayama 2008-04-08
7323687 infrared gas analyzer and infrared gas analysis method Tomoaki Nanko, Hideaki Yamagishi 2008-01-29
7144260 Connector Shigeru Murayama, Masanori Kaneko, Takashi Sekizuka, Hiroyuki Hama 2006-12-05
7125264 Connector Shigeru Murayama, Masanori Kaneko, Takashi Sekizuka, Hiroyuki Hama 2006-10-24
7084657 Bump and method of forming bump 2006-08-01
7033196 Connector, electronic component fixing device, and tester Shigeru Murayama, Masanori Kaneko, Fumio Kurotori 2006-04-25
6963032 High accuracy foamed coaxial cable and method for manufacturing the same Tetsuo Yamaguchi, Mitsuo Iwasaki, Takao Ishido, Takaaki Kusama, Mitsuo Nanjyo +1 more 2005-11-08
6846189 Connector Shigeru Murayama, Masanori Kaneko, Takashi Sekizuka, Hiroyuki Hama 2005-01-25
6724938 Boundary line detecting method and apparatus, image processing method and apparatus, non-boundary line detecting method and apparatus 2004-04-20
RE37961 Pin connector, pin connector holder and packaging board for mounting electronic component 2003-01-07
6416342 Socket and connector therefor for connecting with an electrical component 2002-07-09
6417682 Semiconductor device testing apparatus and its calibration method Toshikazu Suzuki, Hiroyuki Nagai, Noriyoshi Kozuka, Yukio Ishigaki, Takashi Sekizuka +3 more 2002-07-09
6213804 Socket and connector 2001-04-10
D432504 Contactor for semiconductor IC testers 2000-10-24
D426522 Contactor for semiconductor IC testers 2000-06-13
6069481 Socket for measuring a ball grid array semiconductor 2000-05-30