TI

Takaji Ishikawa

AD Advantest: 5 patents #198 of 1,193Top 20%
Overall (All Time): #1,017,112 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
8134381 Connection board, probe card, and electronic device test apparatus comprising same Yoshihiro Abe, Noriaki Shimasaki, Shigeru Matsumura 2012-03-13
7667471 Contact pin probe card and electronic device test apparatus using same Fumio Kurotori, Tadao Saito 2010-02-23
7484285 System for mating and demating multiple connectors mounted on board of semiconductor test apparatus Masanori Kaneko, Hiroyuki Hama, Shigeru Matsumura 2009-02-03
7482821 Probe card and the production method Fumio Kurotori, Tadao Saito 2009-01-27
6932635 Electronic component testing socket and electronic component testing apparatus using the same Hiroto Nakamura 2005-08-23