Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11923321 | Three-dimensional memory device including dielectric rails for warpage reduction and method of making the same | Genta Mizuno, Kenzo IIZUKA, Takayuki Yokoyama, Toshiyuki Sega | 2024-03-05 |
| 9170276 | Coaxial cable member coupled to a signal terminal, a ground terminal and an auxiliary ground conductor with an elastically-deformable piece | Teruhito Suzuki | 2015-10-27 |
| 8905788 | Connector and semiconductor testing device including the connector | Kyoko Oniyama, Akinori Mizumura, Hiroyuki Hama, Hiromitsu Takasu | 2014-12-09 |
| 8860454 | Connector and semiconductor testing device including the connector | Kyoko Oniyama, Akinori Mizumura, Hiroyuki Hama, Hiromitsu Takasu | 2014-10-14 |
| 8790134 | Connector, cable assembly, and semiconductor testing device | Nobumasa Motohashi, Akinori Mizumura, Toshihiro Niitsu, Teruhito Suzuki | 2014-07-29 |
| 8657625 | Connector and semiconductor test device | Hirotaka Wagata, Hiroyuki Hama, Teruhito Suzuki, Hiroyuki Yajima, Akinori Mizumura | 2014-02-25 |
| 8550854 | Edge connector | Masato Okano | 2013-10-08 |
| D597951 | Electrical connector housing | Takahiro Hatano, Makiya Kimura, Tomoyuki Takamoto, Takashi Sokizuka | 2009-08-11 |
| 7544067 | Board mount-type connector and board mount-type connector assembly | Takahiro Hatano, Makiya Kimura, Tomoyuki Takamoto, Takashi Sekizuka | 2009-06-09 |
| D584693 | Electrical connector | Takahiro Hatano, Makiya Kimura, Tomoyuki Takamoto, Takashi Sekizuka | 2009-01-13 |
| 7474109 | Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus | Tetsuya Kuitani, Tadao Saito, Shigeru Matsumura | 2009-01-06 |
| D583769 | Electrical connector | Takahiro Hatano, Makiya Kimura, Tomoyuki Takamoto, Takashi Sekizuka | 2008-12-30 |
| D581876 | Electrical connector | Takahiro Hatano, Makiya Kimura, Tomoyuki Takamoto, Takashi Sekizuka | 2008-12-02 |
| 7202686 | Socket and test apparatus | — | 2007-04-10 |