Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9583854 | Connector and semiconductor testing device having the same | Ryo Uesaka, Jun Watanabe, Akinori Mizumura | 2017-02-28 |
| 8657625 | Connector and semiconductor test device | Shin Sakiyama, Hiroyuki Hama, Teruhito Suzuki, Hiroyuki Yajima, Akinori Mizumura | 2014-02-25 |
| 8558568 | Connector and semiconductor testing device using the same | Ryo Uesaka, Jun Watanabe, Akinori Mizumura | 2013-10-15 |
| 7359814 | Multi-port analysis apparatus and method and calibration method thereof | Yoshikazu Nakayama, Minoru Iida | 2008-04-15 |
| 6421624 | Multi-port device analysis apparatus and method and calibration method thereof | Yoshikazu Nakayama | 2002-07-16 |