Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8324925 | Output buffer circuit and differential output buffer circuit, and transmission method | Satoshi Muraoka, Norio Chujo | 2012-12-04 |
| 7990529 | Detection circuit and foreign matter inspection apparatus for semiconductor wafer | Masami Makuuchi, Takahiro Jingu | 2011-08-02 |
| 7969197 | Output buffer circuit and differential output buffer circuit, and transmission method | Satoshi Muraoka, Norio Chujo | 2011-06-28 |
| 7928365 | Method and apparatus for mass spectrometry | Fujio Oonishi, Kenichi Shinbo, Yasushi Terui, Tsukasa Shishika | 2011-04-19 |
| 7890074 | Data acquisition system | Kenichi Shinbo, Fujio Oonishi, Yasushi Terui, Tsukasa Shishika | 2011-02-15 |
| 7817362 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Wen Li, Shinji Homma | 2010-10-19 |
| 7692445 | Output buffer circuit and differential output buffer circuit, and transmission method | Satoshi Muraoka, Norio Chujo | 2010-04-06 |
| 7668027 | Semiconductor device, testing and manufacturing methods thereof | Kengo Imagawa, Masami Makuuchi, Yoshiharu Ikeda, Koichiro Eguchi | 2010-02-23 |
| 7476850 | Method and its apparatus for mass spectrometry | Fujio Oonishi, Kenichi Shinbo, Yasushi Terui, Tsukasa Shishika | 2009-01-13 |
| 7474290 | Semiconductor device and testing method thereof | Masami Makuuchi, Norio Chujo, Kengo Imagawa, Yoshitomo Arai | 2009-01-06 |
| 7443373 | Semiconductor device and the method of testing the same | Kengo Imagawa, Masami Makuuchi, Norio Chujo, Yoshitomo Arai | 2008-10-28 |
| 7358953 | Semiconductor device and testing method of semiconductor device | Masami Makuuchi, Kengo Imagawa, Norio Chujo, Yoshitomo Arai, Atsushi Obuchi | 2008-04-15 |
| 7276900 | Magnetic characteristic inspecting apparatus and inspecting method using it | Masayoshi Takahashi, Masami Makuuchi, Shinji Homma | 2007-10-02 |
| 6768953 | Test apparatus | Fujio Oonishi, Kenichi Shinbo, Masashi Fukuzaki, Nobuo Motoki | 2004-07-27 |
| 6697755 | Test apparatus | Fujio Oonishi, Kenichi Shinbo, Masashi Fukuzaki, Nobuo Motoki | 2004-02-24 |
| 5811877 | Semiconductor device structure | Ichiro Miyano, Ikuo Kawaguchi, Kunio Matsumoto, Junichi Saeki, Tooru Yoshida +7 more | 1998-09-22 |
| 5438259 | Digital circuitry apparatus | Kosuke Kendo, Yoshihiko Hayashi | 1995-08-01 |
| 5406198 | Digital circuitry apparatus | Kosuke Kendo, Yoshihiko Hayashi | 1995-04-11 |
| 4855970 | Time interval measurement apparatus | Yoshihiko Hayashi | 1989-08-08 |
| 4755758 | Wave formatter for a logic circuit testing system | — | 1988-07-05 |