Issued Patents All Time
Showing 1–25 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Takanori Kondo, Nobuhiro Obara, Masami Makuuchi | 2025-09-23 |
| 12400889 | Defect inspection device | Hiromichi Yamakawa, Yuta Urano, Shunichi Matsumoto, Masaya Yamamoto, Eiji Arima | 2025-08-26 |
| 12366443 | Surface inspection device and shape measurement software | Takeru UTSUGI | 2025-07-22 |
| 12366538 | Defect inspection apparatus and defect inspection method | Yuta Urano, Eiji Arima, Hiromichi Yamakawa, Shunichi Matsumoto, Hisaaki Kanai | 2025-07-22 |
| 12345661 | Defect inspection apparatus and defect inspection method | Shunichi Matsumoto, Nobuhiro Obara | 2025-07-01 |
| 12345654 | Defect inspection device, defect inspection method, and adjustment substrate | Yuta Urano, Eiji Arima, Hiromichi Yamakawa | 2025-07-01 |
| 12313566 | Defect inspection device and defect inspection method | Yuta Urano, Shunichi Matsumoto, Hisaaki Kanai | 2025-05-27 |
| 12292389 | Defect inspection apparatus | — | 2025-05-06 |
| 12196673 | Defect inspection apparatus and defect inspection method | Takeru UTSUGI, Andreas Karsaklian Dal Bosco, Tomoto Kawamura, Kenshiro OHTSUBO | 2025-01-14 |
| 12146840 | Defect inspection device | Eiji Arima, Shunichi Matsumoto | 2024-11-19 |
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Masami Makuuchi, Nobuhiro Obara, Shunichi Matsumoto | 2024-07-23 |
| 12025569 | Defect inspection device and inspection method, and optical module | Shunichi Matsumoto, Eiji Arima, Yuta Urano | 2024-07-02 |
| 11442024 | Defect classification device, inspection device, and inspection system | Takanori Kondo, Akira Hamamatsu, Hideo Ota, Yoshio Kimoto | 2022-09-13 |
| 11346791 | Inspection device and inspection method thereof | Masami Makuuchi, Nobuhiro Obara, Shunichi Matsumoto, Akira Hamamatsu | 2022-05-31 |
| 11143600 | Defect inspection device | Masami Makuuchi, Shunichi Matsumoto, Akira Hamamatsu, Nobuhiro Obara | 2021-10-12 |
| 11143598 | Defect inspection apparatus and defect inspection method | Shunichi Matsumoto, Masami Makuuchi, Yuta Urano, Keiko Oka | 2021-10-12 |
| 11041815 | Inspection information generation device, inspection information generation method, and defect inspection device | Takahiro Urano, Takashi Hiroi, Nobuaki Hirose | 2021-06-22 |
| 10955361 | Defect inspection apparatus and pattern chip | Yuta Urano, Akio Yazaki, Yukihiro Shibata, Hideki Fukushima, Yasuhiro Yoshitake | 2021-03-23 |
| 10948424 | Defect inspection device, pattern chip, and defect inspection method | Yuta Urano, Yukihiro Shibata, Yasuhiro Yoshitake, Hideki Fukushima | 2021-03-16 |
| 10861145 | Defect inspection device and defect inspection method | Takahiro Urano, Hisashi Hatano, Hironori Sakurai | 2020-12-08 |
| 10830706 | Defect inspection apparatus and defect inspection method | Shunichi Matsumoto, Masami Makuuchi, Yuta Urano, Keiko Oka | 2020-11-10 |
| 10816484 | Flaw inspection device and flaw inspection method | Takahiro Urano, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai | 2020-10-27 |
| 10642164 | Defect detection device and defect observation device | Yuko Otani, Kazuo Aoki, Nobuhiko KANZAKI | 2020-05-05 |
| 10466181 | Flaw inspection device and flaw inspection method | Takahiro Urano, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai | 2019-11-05 |
| 10401300 | Defect observation method and device and defect detection device | Yuko Otani, Yuta Urano | 2019-09-03 |