Issued Patents All Time
Showing 26–50 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10261026 | Defect inspection method, low light detecting method, and low light detector | Yuta Urano, Takahiro Jingu | 2019-04-16 |
| 10228332 | Defect inspection device and defect inspection method | Yuta Urano, Shunichi Matsumoto, Taketo Ueno, Yuko Otani | 2019-03-12 |
| 9976966 | Defect inspection method and its device | Yukihiro Shibata, Kei Shimura, Sachio Uto | 2018-05-22 |
| 9865046 | Defect inspection method and defect inspection device | Takahiro Urano | 2018-01-09 |
| 9778206 | Defect inspection device and defect inspection method | Takahiro Urano, Hidetoshi Nishiyama | 2017-10-03 |
| 9773641 | Method and apparatus for observing defects | Yuko Otani, Yuta Urano | 2017-09-26 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Yuta Urano, Takehiro Hirai, Satoru Takahashi +1 more | 2017-08-15 |
| 9683946 | Method and device for detecting defects and method and device for observing defects | Yuko Otani, Taketo Ueno, Hideki Nakayama | 2017-06-20 |
| 9678021 | Method and apparatus for inspecting defects | Yuta Urano | 2017-06-13 |
| 9645094 | Defect inspection device and defect inspection method | Yuta Urano, Takahiro Jingu, Akira Hamamatsu | 2017-05-09 |
| 9606071 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Yuta Urano | 2017-03-28 |
| 9588055 | Defect inspection apparatus and defect inspection method | Yuta Urano, Taketo Ueno, Akira Hamamatsu | 2017-03-07 |
| 9588054 | Defect inspection method, low light detecting method and low light detector | Yuta Urano, Takahiro Jingu | 2017-03-07 |
| 9568439 | Defect inspection device and defect inspection method | Yuta Urano, Takahiro Jingu, Akira Hamamatsu | 2017-02-14 |
| 9523648 | Defect inspection device and defect inspection method | Yuta Urano, Yukihiro Shibata | 2016-12-20 |
| 9513228 | Defect inspection method and its device | Yukihiro Shibata, Kei Shimura, Sachio Uto | 2016-12-06 |
| 9506876 | X-ray inspection device, inspection method, and X-ray detector | Yuta Urano, Yasuko Aoki | 2016-11-29 |
| 9488596 | Defect inspection method and device for same | Yuta Urano, Hisashi Hatano | 2016-11-08 |
| 9470640 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Yukihiro Shibata, Yuta Urano | 2016-10-18 |
| 9436990 | Defect observation method and device therefor | Yuko Otani, Shunichi Matsumoto | 2016-09-06 |
| 9390490 | Method and device for testing defect using SEM | Yuji Takagi, Minoru Harada, Ryo Nakagaki, Naoki Hosoya, Takehiro Hirai | 2016-07-12 |
| 9360434 | Optical inspection apparatus and method thereof | Kenji Nakahira | 2016-06-07 |
| 9329137 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Yuta Urano | 2016-05-03 |
| 9329136 | Defect inspection device and defect inspection method | Yuta Urano, Takahiro Jingu, Akira Hamamatsu | 2016-05-03 |
| 9310318 | Defect inspection method and defect inspection device | Yuta Urano, Yukihiro Shibata | 2016-04-12 |