Issued Patents All Time
Showing 25 most recent of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12333695 | Sample observation system and image processing method | Naoaki KONDO, Yohei Minekawa | 2025-06-17 |
| 12260545 | Sample observation device and method | Yuki Doi, Naoaki KONDO, Hideki Nakayama, Yohei Minekawa, Yuji Takagi | 2025-03-25 |
| 12154264 | Defect inspecting system and defect inspecting method | Naoaki KONDO, Yohei Minekawa | 2024-11-26 |
| 11670528 | Wafer observation apparatus and wafer observation method | Naoaki KONDO, Yohei Minekawa, Takehiro Hirai | 2023-06-06 |
| 11260493 | Substrate processing apparatus and control method | Takahiro Nanjo, Hiroyuki Takenaka, Naoki Matsuda | 2022-03-01 |
| 11177111 | Defect observation device | Akira Ito, Yohei Minekawa, Takehiro Hirai | 2021-11-16 |
| 11170483 | Sample observation device and sample observation method | Yuji Takagi, Naoaki KONDO, Takehiro Hirai | 2021-11-09 |
| 11087454 | Defect observation device and defect observation method | Naoaki KONDO, Yuji Takagi, Takehiro Hirai | 2021-08-10 |
| 10977786 | Wafer observation device | Naoaki KONDO, Yuji Takagi, Takehiro Hirai | 2021-04-13 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Yuji Takagi, Naoaki KONDO, Takehiro Hirai, Yohei Minekawa | 2021-04-06 |
| 10810733 | Defect classification apparatus and defect classification method | Naoaki KONDO, Takehiro Hirai, Yuji Takagi | 2020-10-20 |
| 10783625 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Ryo Nakagaki, Fumihiko Fukunaga, Yuji Takagi | 2020-09-22 |
| 10559074 | Sample observation device and sample observation method | Yuji Takagi, Naoaki KONDO, Takehiro Hirai | 2020-02-11 |
| RE47779 | Simple electronic musical instrument, player's console and signal processing system incorporated therein | So Tanaka | 2019-12-24 |
| 10229812 | Sample observation method and sample observation device | Yuji Takagi, Takehiro Hirai | 2019-03-12 |
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Yuji Takagi, Takehiro Hirai, Ryo Nakagaki | 2019-02-12 |
| 9922414 | Defect inspection method and defect inspection device | Yuji Takagi, Masashi Sakamoto, Takehiro Hirai | 2018-03-20 |
| 9811897 | Defect observation method and defect observation device | Yuji Takagi, Ryo Nakagaki, Takehiro Hirai, Hirohiko Kitsuki | 2017-11-07 |
| 9799112 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Ryo Nakagaki, Fumihiko Fukunaga, Yuji Takagi | 2017-10-24 |
| 9569836 | Defect observation method and defect observation device | Takehiro Hirai, Ryo Nakagaki | 2017-02-14 |
| 9401015 | Defect classification method, and defect classification system | Yohei Minekawa, Yuji Takagi, Takehiro Hirai, Ryo Nakagaki | 2016-07-26 |
| 9390490 | Method and device for testing defect using SEM | Yuji Takagi, Ryo Nakagaki, Naoki Hosoya, Toshifumi Honda, Takehiro Hirai | 2016-07-12 |
| 9342879 | Method and apparatus for reviewing defect | Yohei Minekawa, Kenji Nakahira, Takehiro Hirai, Ryo Nakagaki | 2016-05-17 |
| 9311697 | Inspection method and device therefor | Ryo Nakagaki, Takehiro Hirai, Naoki Hosoya | 2016-04-12 |
| 9165356 | Defect inspection method and defect inspection device | Atsushi Miyamoto, Takehiro Hirai, Fumihiko Fukunaga | 2015-10-20 |