Issued Patents All Time
Showing 1–25 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11670528 | Wafer observation apparatus and wafer observation method | Naoaki KONDO, Minoru Harada, Yohei Minekawa | 2023-06-06 |
| 11434289 | Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate | Kenji IIDA, Tomoko TERAUCHI, Kensuke Nakamura | 2022-09-06 |
| 11177111 | Defect observation device | Akira Ito, Minoru Harada, Yohei Minekawa | 2021-11-16 |
| 11170483 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Naoaki KONDO | 2021-11-09 |
| 11087454 | Defect observation device and defect observation method | Naoaki KONDO, Minoru Harada, Yuji Takagi | 2021-08-10 |
| 10977786 | Wafer observation device | Naoaki KONDO, Minoru Harada, Yuji Takagi | 2021-04-13 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Minoru Harada, Yuji Takagi, Naoaki KONDO, Yohei Minekawa | 2021-04-06 |
| 10906974 | Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate | Kenji IIDA, Tomoko TERAUCHI, Kensuke Nakamura | 2021-02-02 |
| 10810733 | Defect classification apparatus and defect classification method | Naoaki KONDO, Minoru Harada, Yuji Takagi | 2020-10-20 |
| 10770260 | Defect observation device | Yuko Otani, Yohei Minekawa, Takashi Nobuhara, Nobuhiko KANZAKI, Miyuki Fukuda +3 more | 2020-09-08 |
| 10559074 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Naoaki KONDO | 2020-02-11 |
| 10297021 | Defect quantification method, defect quantification device, and defect evaluation value display device | Yohei Minekawa, Yuji Takagi | 2019-05-21 |
| 10229812 | Sample observation method and sample observation device | Minoru Harada, Yuji Takagi | 2019-03-12 |
| 10203851 | Defect classification apparatus and defect classification method | Yohei Minekawa, Yuji Takagi, Minoru Harada, Ryo Nakagaki | 2019-02-12 |
| 10168286 | Defect observation device and defect observation method | Hideki Nakayama, Kenichi Nishigata | 2019-01-01 |
| 10074511 | Defect image classification apparatus | Yohei Minekawa, Yutaka Tandai | 2018-09-11 |
| 9922414 | Defect inspection method and defect inspection device | Yuji Takagi, Minoru Harada, Masashi Sakamoto | 2018-03-20 |
| 9842723 | Defect observation system and defect observation method | Masashi Sakamoto, Hideki Nakayama | 2017-12-12 |
| 9811897 | Defect observation method and defect observation device | Minoru Harada, Yuji Takagi, Ryo Nakagaki, Hirohiko Kitsuki | 2017-11-07 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Yuta Urano, Toshifumi Honda, Satoru Takahashi +1 more | 2017-08-15 |
| 9685301 | Charged-particle radiation apparatus | Ryo Nakagaki, Kenji Obara | 2017-06-20 |
| 9582875 | Defect analysis assistance device, program executed by defect analysis assistance device, and defect analysis system | Ryo Nakagaki, Kenji Obara | 2017-02-28 |
| 9569836 | Defect observation method and defect observation device | Ryo Nakagaki, Minoru Harada | 2017-02-14 |
| 9401015 | Defect classification method, and defect classification system | Yohei Minekawa, Yuji Takagi, Minoru Harada, Ryo Nakagaki | 2016-07-26 |
| 9390490 | Method and device for testing defect using SEM | Yuji Takagi, Minoru Harada, Ryo Nakagaki, Naoki Hosoya, Toshifumi Honda | 2016-07-12 |