Issued Patents All Time
Showing 51–75 of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8013299 | Review method and review device | Kenji Obara, Kohei Yamaguchi, Naoma Ban | 2011-09-06 |
| 7925367 | Defect review and classification system | Kazuo Aoki, Kenji Obara | 2011-04-12 |
| 7873205 | Apparatus and method for classifying defects using multiple classification modules | Hirohito Okuda, Yuji Takagi, Toshifumi Honda, Atsushi Miyamoto | 2011-01-18 |
| 7869969 | Defect review apparatus and method of reviewing defects | Kenji Obara, Kohei Yamaguchi | 2011-01-11 |
| 7855056 | Antibody against tumor specific antigen as target | Kimihisa Ichikawa, Shu Takahashi, Toshinori Agatsuma, Keisuke Fukuchi | 2010-12-21 |
| 7844874 | Semiconductor integrated circuit device and inspection method therefor | Nobuyuki Moriwaki | 2010-11-30 |
| 7836398 | Report format setting method and apparatus, and defect review system | — | 2010-11-16 |
| 7752001 | Method of correcting coordinates, and defect review apparatus | Kazuo Aoki, Kumi Kaneko | 2010-07-06 |
| 7741447 | Antibody against tumor specific antigen as target | Kimihasa Ichikawa, Shu Takahashi, Toshinori Agatsuma, Keisuke Fukuchi | 2010-06-22 |
| 7664562 | Automatic defect review and classification system | Kazuo Aoki, Kenji Obara | 2010-02-16 |
| 7656171 | Method and apparatus for reviewing defects by detecting images having voltage contrast | Toshifumi Honda | 2010-02-02 |
| 7584012 | Automatic defect review and classification system | Kazuo Aoki, Kenji Obara | 2009-09-01 |
| 7485858 | Inspection method for semiconductor wafer and apparatus for reviewing defects | Kenji Obara | 2009-02-03 |
| 7449898 | Method and apparatus for reviewing defects by detecting images having voltage contrast | Toshifumi Honda | 2008-11-11 |
| 7361340 | Antibody against tumor specific antigen as target | Kimihasa Ichikawa, Shu Takahashi, Toshinori Agatsuma, Keisuke Fukuchi | 2008-04-22 |
| 6968079 | Investigation device and investigation method | Akira Yoshikawa, Kazuhisa Machida, Hitoshi Komuro, Katsuhiro Kitahashi | 2005-11-22 |
| 6770517 | Semiconductor device and method for fabricating the same | Hiroaki Nakaoka, Hiromasa Fujimoto, Atsushi Hori, Takashi Uehara | 2004-08-03 |
| 6395598 | Semiconductor device and method for fabricating the same | Hiroyuki Kamada, Hiroyuki Kawahara, Ichiro Nakao | 2002-05-28 |
| 6337500 | Semiconductor device and method for fabricating the same | Hiroaki Nakaoka, Hiromasa Fujimoto, Atsushi Hori, Takashi Uehara | 2002-01-08 |
| 6297517 | Semiconductor device and method of fabricating the same | Michikazu Matsumoto | 2001-10-02 |
| 6140687 | High frequency ring gate MOSFET | Hiroshi Shimomura, Joji Hayashi, Takashi Nakamura | 2000-10-31 |
| 5905284 | Semiconductor device with a particular DMISFET structure | Taizo Fujii, Sugao Fujinaga | 1999-05-18 |
| 5866463 | Method of manufacturing a semiconductor apparatus | Mitsuo Tanaka, Atsushi Hori, Hiroshi Shimomura, Yoshihiko Horikawa | 1999-02-02 |
| 5851863 | Semiconductor device | Taizo Fujii, Sugao Fujinaga | 1998-12-22 |
| 5838048 | Semiconductor Bi-MIS device | Masahiro Nakatani, Mitsuo Tanaka, Akihiro Kanda | 1998-11-17 |