Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12227872 | Single-crystal pulling apparatus and single-crystal pulling method | Kiyotaka Takano, Wataru Yajima, Kosei Sugawara, Tomohiko Ohta | 2025-02-18 |
| 12188153 | Single-crystal pulling apparatus with saddle-shaped superconducting coils and single-crystal pulling method | Kiyotaka Takano, Kosei Sugawara, Takahide ONAI, Tomohiko Ohta | 2025-01-07 |
| 11081556 | Silicon carbide semiconductor device | — | 2021-08-03 |
| 10400353 | Method for controlling resistivity and N-type silicon single crystal | Ryoji Hoshi, Kiyotaka Takano | 2019-09-03 |
| 10066322 | Method for heat treatment of silicon single crystal wafer | Ryoji Hoshi | 2018-09-04 |
| 9938640 | Method for heat treatment of silicon single crystal wafer | Ryoji Hoshi | 2018-04-10 |
| 9850595 | Method for heat treatment of silicon single crystal wafer | Ryoji Hoshi | 2017-12-26 |
| 9773710 | Method for evaluating concentration of defect in silicon single crystal substrate | Ryoji Hoshi | 2017-09-26 |
| 9650725 | Method for manufacturing a defect-controlled low-oxygen concentration silicon single crystal wafer | Ryoji Hoshi, Kosei Sugawara | 2017-05-16 |
| 9111883 | Method for evaluating silicon single crystal and method for manufacturing silicon single crystal | Ryoji Hoshi, Suguru Matsumoto | 2015-08-18 |
| 8247875 | Fabrication method of semiconductor device | — | 2012-08-21 |
| 7851316 | Fabrication method of semiconductor device | — | 2010-12-14 |
| 7544899 | Printed circuit board | Akira Sato | 2009-06-09 |
| 7294569 | Semiconductor device fabrication method and semiconductor device fabrication system for minimizing film-thickness variations | — | 2007-11-13 |
| 6914000 | Polishing method, polishing system and process-managing system | — | 2005-07-05 |
| 6395598 | Semiconductor device and method for fabricating the same | Takehiro Hirai, Hiroyuki Kawahara, Ichiro Nakao | 2002-05-28 |