HF

Hideki Fukushima

HH Hitachi High-Technologies: 9 patents #394 of 1,917Top 25%
TO Toyota: 2 patents #10,861 of 26,838Top 45%
HC Hayashibara Co.: 1 patents #34 of 78Top 45%
HS Hitachi Automotive Systems: 1 patents #965 of 1,636Top 60%
Overall (All Time): #376,133 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
10955361 Defect inspection apparatus and pattern chip Yuta Urano, Toshifumi Honda, Akio Yazaki, Yukihiro Shibata, Yasuhiro Yoshitake 2021-03-23
10948424 Defect inspection device, pattern chip, and defect inspection method Yuta Urano, Yukihiro Shibata, Toshifumi Honda, Yasuhiro Yoshitake 2021-03-16
10641156 Exhaust pipe structure Yasuhiko Koda, Toshio Murata, Shunsuke Niitani, Chikara Okawa, Takeyuki Harada 2020-05-05
10605146 Exhaust mechanism for vehicle Takeshi Oya, Takatoshi Sugihara 2020-03-31
9606071 Defect inspection method and device using same Yukihiro Shibata, Yuta Urano, Toshifumi Honda 2017-03-28
9329137 Defect inspection method and device using same Yukihiro Shibata, Yuta Urano, Toshifumi Honda 2016-05-03
9176075 Contamination inspection method and contamination inspection device Masanori Gunji, Tomonari Morioka, Hiroshi Akiyama 2015-11-03
8834950 Method for inhibiting the deterioration of eating-quality characteristics of foods containing gelatinized starch Takashi Ohtsuki, Naohiko Katagiri, Toshio Miyake 2014-09-16
8564767 Defect inspecting apparatus and defect inspecting method Nobuaki Hirose 2013-10-22
8422009 Foreign matter inspection method and foreign matter inspection apparatus Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Koichi Nagoya 2013-04-16
8402655 Method of processing orifice Masato Higuma, Kenichi Gunji, Tsuneyoshi Inoue, Yasuyuki Tanaka 2013-03-26
7986405 Foreign matter inspection method and foreign matter inspection apparatus Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Koichi Nagoya 2011-07-26
7719671 Foreign matter inspection method and foreign matter inspection apparatus Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Koichi Nagoya 2010-05-18