Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9964500 | Defect inspection device, display device, and defect classification device | Hisashi Hatano, Mamoru Kobayashi | 2018-05-08 |
| 8422009 | Foreign matter inspection method and foreign matter inspection apparatus | Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Hideki Fukushima | 2013-04-16 |
| 8417769 | Gateway having distributed processing function, and communication terminal | Masaaki Kimura | 2013-04-09 |
| 8154717 | Optical apparatus for defect inspection | Seiji Otani | 2012-04-10 |
| 7986405 | Foreign matter inspection method and foreign matter inspection apparatus | Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Hideki Fukushima | 2011-07-26 |
| 7787115 | Optical apparatus for defect inspection | Seiji Otani | 2010-08-31 |
| 7719671 | Foreign matter inspection method and foreign matter inspection apparatus | Hiroyuki Yamashita, Mamoru Kobayashi, Eiji Imai, Yoshio Morishige, Hideki Fukushima | 2010-05-18 |
| 7557913 | Optical apparatus for defect inspection | Seiji Otani | 2009-07-07 |