Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10448912 | Image processing apparatus | Satoru Esashi, Jun Okada, Toshio Muroi, Nobuo Ogura, Nobuhiro Ohga +2 more | 2019-10-22 |
| 10271804 | X-ray image diagnosis apparatus | Nobuhiro Ohga, Jun Okada, Satoru Esashi, Toshio Muroi, Nobuo Ogura +3 more | 2019-04-30 |
| 9176075 | Contamination inspection method and contamination inspection device | Tomonari Morioka, Hiroshi Akiyama, Hideki Fukushima | 2015-11-03 |
| 7875156 | Probe storage container, prober apparatus, probe arranging method and manufacturing method of probe storage container | Katsunori Nakajima, Yasuhiko Nara, Tsutomu Saito, Shigeru Izawa | 2011-01-25 |
| 7385196 | Method and scanning electron microscope for measuring width of material on sample | Goroku Shimoma, Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe +3 more | 2008-06-10 |
| 7212725 | Recording/reproducing apparatus and picture recording reservation method of recording/reproducing apparatus | Hideo Kataoka, Takahisa Yoneyama | 2007-05-01 |
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Goroku Shimoma, Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe +3 more | 2004-09-14 |