Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7385196 | Method and scanning electron microscope for measuring width of material on sample | Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe, Tadanori Takahashi +3 more | 2008-06-10 |
| 6791084 | Method and scanning electron microscope for measuring dimension of material on sample | Tadashi Otaka, Mitsugu Sato, Hideo Todokoro, Shunichi Watanabe, Tadanori Takahashi +3 more | 2004-09-14 |
| 6166380 | Resolving power evaluation method and specimen for electron microscope | Taiji Kitagawa, Mitsugu Sato, Tadanori Takahashi, Naoto Yoshida, Masayuki Yukii +3 more | 2000-12-26 |