Issued Patents All Time
Showing 51–75 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9291574 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Yukihiro Shibata, Yuta Urano | 2016-03-22 |
| 9267898 | Optical inspection method and optical inspection apparatus | Kenji Nakahira, Toshihiko Nakata | 2016-02-23 |
| 9255793 | Defect inspection method and device thereof | Yukihiro Shibata, Taketo Ueno, Atsushi Taniguchi | 2016-02-09 |
| 9255888 | Defect inspection method and device for same | Yuta Urano, Hisashi Hatano | 2016-02-09 |
| 9239283 | Defect inspection method and device therefor | Yukihiro Shibata, Atsushi Taniguchi | 2016-01-19 |
| 9109194 | Device for harvesting bacterial colony and method therefor | Hiroko Fujita, Muneo Maeshima, Akira Maekawa, Yoshiko Ishida, Yuta Urano +1 more | 2015-08-18 |
| 9075026 | Defect inspection device and defect inspection method | Takahiro Urano, Kaoru Sakai | 2015-07-07 |
| 9041921 | Defect inspection device and defect inspection method | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2015-05-26 |
| 9019492 | Defect inspection device and defect inspection method | Atsushi Taniguchi, Taketo Ueno, Shunichi Matsumoto | 2015-04-28 |
| 8975582 | Method and apparatus for reviewing defects | Hidetoshi Nishiyama, Sachio Uto | 2015-03-10 |
| 8970836 | Defect inspecting apparatus and defect inspecting method | Atsushi Taniguchi, Taketo Ueno, Shunichi Matsumoto, Yukihiro Shibata | 2015-03-03 |
| 8958062 | Defect inspection method and device using same | Yukihiro Shibata, Toshiyuki Nakao, Yuta Urano | 2015-02-17 |
| 8922764 | Defect inspection method and defect inspection apparatus | Yuta Urano, Yukihiro Shibata | 2014-12-30 |
| 8908172 | Defect inspection device and method of inspecting defect | Takahiro Urano | 2014-12-09 |
| 8853628 | Defect inspection method, and device thereof | Naoki Hosoya, Takashi Hiroi | 2014-10-07 |
| 8804112 | Method of defect inspection and device of defect inspection | Yukihiro Shibata, Toshihiko Nakata, Taketo Ueno, Atsushi Taniguchi | 2014-08-12 |
| 8804110 | Fault inspection device and fault inspection method | Yuta Urano, Shigenobu Maruyama, Toshiyuki Nakao, Yukihiro Shibata | 2014-08-12 |
| 8711347 | Defect inspection method and device therefor | Yuta Urano, Yukihiro Shibata, Toshiyuki Nakao | 2014-04-29 |
| 8670116 | Method and device for inspecting for defects | Toshiyuki Nakao, Junguo Xu, Yuki Shimizu, Toshihiko Nakata, Yukihiro Shibata +1 more | 2014-03-11 |
| 8599369 | Defect inspection device and inspection method | Yuta Urano, Shigenobu Maruyama, Toshiyuki Nakao | 2013-12-03 |
| 8581976 | Method and apparatus for reviewing defects of semiconductor device | Masaki Kurihara, Ryo Nakagaki | 2013-11-12 |
| 8547429 | Apparatus and method for monitoring semiconductor device manufacturing process | Yuuji Takagi | 2013-10-01 |
| 8514388 | Flaw inspecting method and device therefor | Shigenobu Maruyama, Toshiyuki Nakao, Yuta Urano | 2013-08-20 |
| 8509516 | Circuit pattern examining apparatus and circuit pattern examining method | Takashi Hiroi, Takeyuki Yoshida, Naoki Hosoya | 2013-08-13 |
| 8461527 | Scanning electron microscope and method for processing an image obtained by the scanning electron microscope | Kenji Nakahira, Atsushi Miyamoto | 2013-06-11 |