Issued Patents All Time
Showing 101–113 of 113 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7424146 | Defect inspection method | Hirohito Okuda | 2008-09-09 |
| 7361896 | Scanning electron microscope and a method for adjusting a focal point of an electron beam of said scanning electron microscope | Munenori Fukunishi, Kenji Obara | 2008-04-22 |
| 7205555 | Defect inspection apparatus and defect inspection method | Hirohito Okuda, Yuji Takagi | 2007-04-17 |
| 7181060 | Defect inspection method | Hirohito Okuda, Yasuhiko Ozawa, Katsuhiro Kitahashi | 2007-02-20 |
| 7170593 | Method of reviewing detected defects | Yuji Takagi, Hirohito Okuda | 2007-01-30 |
| 7105815 | Method and apparatus for collecting defect images | Kenji Obara, Toshiro Kubo | 2006-09-12 |
| 7075077 | Method of observing a specimen using a scanning electron microscope | Hirohito Okuda, Kazuo Aoki, Kohei Yamaguchi, Masashi Sakamoto | 2006-07-11 |
| 6965429 | Method of reviewing detected defects | Yuji Takagi, Hirohito Okuda | 2005-11-15 |
| 6855930 | Defect inspection apparatus and defect inspection method | Hirohito Okuda, Yuji Takagi | 2005-02-15 |
| 6622054 | Method monitoring a quality of electronic circuits and its manufacturing condition and system for it | Hirohito Okuda, Hisae Yamamura, Yuji Takagi, Hideaki Doi, Shigeshi Yoshinaga | 2003-09-16 |
| 6553323 | Method and its apparatus for inspecting a specimen | Kenji Obara, Yuji Takagi, Ryo Nakagaki, Toshiei Kurosaki, Yasuhiko Ozawa | 2003-04-22 |
| 6333992 | Defect judgement processing method and apparatus | Hisae Yamamura, Yukio Matsuyama, Ludwig Listl | 2001-12-25 |
| 6249598 | Solder testing apparatus | Yukio Matsuyama, Guenter Doemens, Peter Mengel, Ludwig Listl | 2001-06-19 |