Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7122796 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 2006-10-17 |
| 6828554 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 2004-12-07 |
| 6717142 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 2004-04-06 |
| 6587581 | Visual inspection method and apparatus therefor | Yuji Takagi, Takashi Hiroi, Maki Tanaka, Asahiro Kuni, Junzou Azuma +2 more | 2003-07-01 |
| 6373054 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 2002-04-16 |
| 6333992 | Defect judgement processing method and apparatus | Hisae Yamamura, Toshifumi Honda, Ludwig Listl | 2001-12-25 |
| 6249598 | Solder testing apparatus | Toshifumi Honda, Guenter Doemens, Peter Mengel, Ludwig Listl | 2001-06-19 |
| 6172365 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 2001-01-09 |
| 5986263 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yuji Takagi +3 more | 1999-11-16 |
| 5780866 | Method and apparatus for automatic focusing and a method and apparatus for three dimensional profile detection | Hisae Yamamura, Takanori Ninomiya, Hideaki Sasazawa | 1998-07-14 |
| 5763123 | Method for producing thin-film substrate | Chie Shishido, Hiroya Hoshishiba, Haruhisa Sakamoto | 1998-06-09 |
| 5376023 | Electric connector | — | 1994-12-27 |
| 5293538 | Method and apparatus for the inspection of defects | Hisafumi Iwata, Hitoshi Kubota | 1994-03-08 |
| 5054944 | Serial printer having a carrier cable connected to a movable print head | — | 1991-10-08 |
| 4959030 | Electrical connector for connecting two flat cables to a circuit board | Yu Tatebe, Hiroshi Yasui, Hiroji Takahashi | 1990-09-25 |
| 4860371 | Method and apparatus for detecting pattern defects | Toshiaki Ichinose | 1989-08-22 |
| 4628531 | Pattern checking apparatus | Keiichi Okamoto, Kozo Nakahata, Hideaki Doi, Susumu Aiuchi, Mineo Nomoto | 1986-12-09 |