Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5463667 | Inspection method for soldered joints using x-ray imaging and apparatus therefor | Takanori Ninomiya, Asahiro Kuni, Kozo Nakahata, Toshimitsu Hamada, Toshihiko Ayabe | 1995-10-31 |
| 5278012 | Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate | Chie Yamanaka, Takanori Ninomiya, Hisafumi Iwata, Yasuo Nakagawa, Nobuyuki Akiyama | 1994-01-11 |
| 4953224 | Pattern defects detection method and apparatus | Takanori Ninomiya, Yasuo Nakagawa | 1990-08-28 |
| 4860371 | Method and apparatus for detecting pattern defects | Yukio Matsuyama | 1989-08-22 |