Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10366963 | Noble metal paste for bonding of semiconductor element | Masayuki Miyairi, Katsuji Inagaki, Toshinori Ogashiwa | 2019-07-30 |
| 10106691 | Metal paste for gas sensor electrode formation | Nobuhisa Okamoto, Takuya Hosoi, Akihiro Nakai, Shigekazu Onozumi | 2018-10-23 |
| 9758680 | Metal paste for gas sensor electrode formation | Nobuhisa Okamoto, Takuya Hosoi, Akihiro Nakai, Shigekazu Onozumi | 2017-09-12 |
| 9539671 | Precious metal paste for bonding semiconductor element | Masayuki Miyairi, Katsuji Inagaki, Toshinori Ogashiwa | 2017-01-10 |
| 8201973 | Flame detector | Akihisa Kudoh, Kazuyoshi Sakurai, Hiroshi Kaneko, Masahiro Katagiri | 2012-06-19 |
| D651926 | Fire detector | Satoshi Yanagisawa, Masahito Ando | 2012-01-10 |
| D621287 | Fire detector | Hiroshi Kaneko, Kazuyoshi Sakurai, Akihisa Kudoh | 2010-08-10 |
| 6057775 | Ionization smoke detector | Kazuyoshi Sakurai | 2000-05-02 |
| 5747364 | Method of making semiconductor wafers and semiconductor wafers made thereby | Fumitaka Kai, Masahiko Maeda, Hirofumi Hajime, Naoki Yamada | 1998-05-05 |
| D382217 | Fire detector | Kazuyoshi Sakurai | 1997-08-12 |
| 5278012 | Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate | Chie Yamanaka, Toshiaki Ichinose, Takanori Ninomiya, Hisafumi Iwata, Yasuo Nakagawa | 1994-01-11 |
| 5245270 | Energy storage system | — | 1993-09-14 |
| 5098191 | Method of inspecting reticles and apparatus therefor | Minori Noguchi, Hiroaki Shishido, Mitsuyoshi Koizumi, Toshihilo Nakata | 1992-03-24 |
| 5046847 | Method for detecting foreign matter and device for realizing same | Toshihiko Nakata, Yoshihiko Yamuchi, Mitsuyoshi Koizumi, Yoshimasa Oshima | 1991-09-10 |
| 4965454 | Method and apparatus for detecting foreign particle | Toshihiko Yamauchi | 1990-10-23 |
| 4938598 | Method and apparatus for position detection on reduction-projection system | Yoshihiko Yamauchi | 1990-07-03 |
| 4925755 | Method of correcting defect in circuit pattern | Hiroshi Yamaguchi, Keiya Saito, Akira Shimase, Satoshi Haraichi, Susumu Aiuchi +2 more | 1990-05-15 |
| 4788577 | Substrate surface deflecting device | Asahiro Kuni, Yukio Kembo, Toshihiko Nakata | 1988-11-29 |
| 4647196 | Surface flaw detection method | Asahiro Kuni, Kazuo Yamaguchi, Juro Endo | 1987-03-03 |
| 4614427 | Automatic contaminants detection apparatus | Mitsuyoshi Koizumi, Yoshimasa Oshima, Toshiaki Yachi | 1986-09-30 |
| 4541715 | Apparatus for detecting contaminants on the reticle of exposure system | Mitsuyoshi Koizumi | 1985-09-17 |
| 4508453 | Pattern detection system | Yasuhiko Hara, Satoru Fushimi, Yoshimasa Oshima, Nobuhiko Aoki | 1985-04-02 |
| 4504045 | Wafer transforming device | Yukio Kenbo, Mitsuyoshi Koizumi, Asahiro Kuni | 1985-03-12 |
| 4491787 | Flatness measuring device | Yukio Kembo, Yasuo Nakagawa | 1985-01-01 |
| 4475223 | Exposure process and system | Motoya Taniguchi, Mitsuyoshi Koizumi, Yukio Kembo, Minoru Ikeda | 1984-10-02 |