Issued Patents All Time
Showing 26–35 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4460273 | Test apparatus for defects of plate | Mitsuyoshi Koizumi, Yoshimasa Ohshima | 1984-07-17 |
| 4449818 | Method of inspecting microscopic surface defects | Kazuo Yamaguchi, Asahiro Kuni, Juro Endo | 1984-05-22 |
| 4447731 | Exterior view examination apparatus | Asahiro Kuni, Yukio Kembo, Nobuhiko Aoki | 1984-05-08 |
| 4433235 | Focusing position detecting device in optical magnifying and observing apparatus | Yoshimasa Ohshima, Mitsuyoshi Koizumi | 1984-02-21 |
| 4423331 | Method and apparatus for inspecting specimen surface | Mitsuyoshi Koizumi, Yoshimasa Oshima | 1983-12-27 |
| 4403336 | X-Ray exposure apparatus | Motoya Taniguchi, Minoru Ikeda | 1983-09-06 |
| 4391511 | Light exposure device and method | Yukio Kembo, Yasuo Nakagawa, Susumu Aiuchi, Mineo Nomoto | 1983-07-05 |
| 4362389 | Method and apparatus for projection type mask alignment | Mituyoshi Koizumi, Yoshimasa Oshima | 1982-12-07 |
| 4343553 | Shape testing apparatus | Yasuo Nakagawa, Hiroshi Makihira, Yoshitada Oshida | 1982-08-10 |
| 4242702 | Apparatus for automatically checking external appearance of object | Asahiro Kuni, Yoshimasa Oshima | 1980-12-30 |